Fluid property investigation by impedance characterization of quartz crystal resonators: Part I: Methodology, crystal screening, and Newtonian fluids

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Abstract

In the first of this two-part communication, we present a methodology for the application of thickness shear mode (TSM) quartz crystal resonators (QCR) in fluid property investigation. To this end, we outline a protocol for the preparation of crystal surfaces for fluid contact and establish a methodology for the pre-screening of quartz crystals for application in fluid property investigation. We also present a data fitting algorithm which enables the conversion of raw impedance data into equivalent circuit parameters. Subsequently, we report on our study of a series of Newtonian fluids (2-propanol/water solutions) by frequency response analysis of the fluid-contacted TSM QCR. The results are analyzed in comparison to theoretical predictions presented in an earlier publication. The results show good agreement between the theory and experimentally derived equivalent circuit parameters. The influence of fluid elasticity on the impedance response of liquid-contacted thickness-shear mode (TSM) quartz crystal resonators (QCR) is investigated in the second part. Model predictions are compared to experimental results on a series of a TSM QCR contacted with poly(dimethylsiloxane) fractions. The findings show that with appropriate instrumentation and models to interpret results, TSM QCR can be rapid and effective tools in viscoelastic fluid property investigation.

Keywords

Piezoelectric
Quartz
Crystal
Resonator
Resonance
Impedance
Thickness-shear
Viscoelastic
Fluid property
Equivalent circuit
Isopropyl alcohol (IPA)
Poly(dimethylsiloxane) (PDMS)

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Emeka Nwankwo is a research engineer in the Advanced Process Modelling, Optimization and Control Group in the Central Research and Development Division (CR & D) of E.I. du Pont de Nemours, in Wilmington, DE, USA. He received a Bachelor's degree (with Honours) from the University of Ife in Nigeria in 1987, a Master's degree from the University of Rochester in 1992, and the degree of Doctor of Engineering Science (DEngSc) in chemical engineering from Columbia University in the City of New York, in 1996. He joined the staff of the DuPont Experimental Station in 1995. His principal research interests are in sensor development; agent-based modelling of (chemical) business enterprises and operations; and the application of high-performance computing techniques to chemical process modelling and optimization.
Chris Durning is Professor of Chemical Engineering and Applied Chemistry in the School of Engineering and Applied Sciences at Columbia University in New York City. He received a Bachelor's degree in Chemical Engineering from Columbia in 1978 and a doctorate from Princeton in 1983; he joined the faculty at Columbia in 1983. During the past decade, he has held a variety of visiting research positions, in industry, academia, and the national laboratories in the US, including posts at duPont, IBM, Ford Motor, CALTECH, University of Minnesota, University of Connecticut and Los Alamos. He has published about 60 peer-reviewed papers on government and industry supported research on diffusion, adhesion and adsorption in polymer systems.