Cerium oxide stoichiometry alteration via Sn deposition: Influence of temperature

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Abstract

Cerium oxide layers grown on Cu(1 1 1) were studied by conventional X-ray and resonant photoelectron spectroscopy with synchrotron radiation. A quantitative method of determining the cerium chemical state from the Ce 3d photoelectron spectra is described in detail. After the preparation of the ceria layer, Sn films of different thickness were evaporated onto the surface at temperatures of 120, 300 and 520 K. In all three cases, the deposited Sn was oxidized, CeO2 was partially reduced, and a mixed Sn–Ce–O oxide was formed. The quantitative extent of these reactions was found to be determined by limited diffusion of the deposited Sn atoms into the ceria layer at low temperature. The excess of tin formed a metallic overlayer on the sample surface.

Introduction

Besides alumina, one of the most important ceramic materials nowadays is cerium oxide (ceria; CeO2). Various sectors of industry use ceria for its excellent properties in electronic, physical, chemical and optical applications. The catalytic behaviour of cerium oxide makes it an important part of solid-oxide fuel cells and three-way catalysts in the automotive industry [1], [2].

A very important property of ceria is its oxygen storage capacity. Under reducing conditions, e.g. during catalytic reaction on the surface, ceria can release a part of its oxygen content and provide it to the reaction. This process includes a transformation from CeO2 to Ce2O3 and a change of the crystal structure from cubic fluorite to hexagonal. For this transition, relatively low activation energy is needed and oxygen vacancies exhibit a high mobility. The transition is reversible and re-oxidation to stoichiometric CeO2 is possible in the presence of oxygen in the ambient atmosphere [3].

Some dopants may further improve the catalytic properties of cerium oxide. They can be either catalytically active transition metals forming active metal particles on the ceria surface [4] or metals strongly interacting with cerium and oxygen [5], [6]. In the latter case the bond strength between cerium and oxygen is decreased, a large number of defects are introduced into the crystal structure acting as active sites for the catalyzed reaction, the activation energy of the cerium chemical state alteration is decreased and the oxygen storage capacity is improved. Tin is such a metal, and tin dioxide, SnO2, is an important compound used in heterogeneous catalysts and semiconductor gas sensors. Sn forms with Ce several bulk intermetallic compounds exhibiting high melting points in the range from 1435 to 1673 K (CeSn3, Ce2Sn3, Ce2Sn), much higher than that of the single components (Ce 1071 K, Sn 505 K) [7]. Such a strong interaction leads to formation of a mixed Sn–Ce–O oxide that exhibits higher catalytic activity than both pure individual oxides [6], [8], [9].

From the behaviour described above it can be seen that it is important to study the interaction of ceria with metals, other oxides and gases, and the chemical state of cerium is a key parameter in these studies. It is most usually determined by conventional X-ray photoelectron spectroscopy (XPS) of the Ce 3d line [10], [11]. The electronic configuration of CeO2 (Ce4+) is characterized by unoccupied 4f orbitals (4f0) and Ce2O3 (Ce3+) by a 4f1 configuration. The differences influence the shape of both core level and valence band photoelectron spectra. Using tunable synchrotron radiation allows the acquisition of valence band spectra with high surface sensitivity and energy resolution, and sensitivity to the fingerprints of the cerium chemical state can be hugely amplified using resonance effects in the Ce 4d–4f photoabsorption region [12].

For model studies, ceria is commercially available in the form of single crystals or a nanopowder, but both suffer from charging effects in electron spectroscopy. To avoid charging caused by their low electrical conductivity, thin films have been grown on different single-crystalline substrates, such as Pt(1 1 1) [11], Re(0 0 0 1) [3], or Cu(1 1 1) [13]. We have developed a procedure for growth of continuous oriented CeO2 layers on Cu(1 1 1) with a very low number of defects in the structure and good stoichiometry [14].

In our previous papers [15], [16], the interaction of Sn with these CeO2 layers was studied after tin deposition on the oxide surface at 520 K (i.e. the same temperature as used for the CeO2 growth on a Cu(1 1 1) single crystal) and immediate formation of the mixed Sn–Ce–O compound was found. The aim of the present work was to check how the temperature influences the tin-induced ceria reduction. We suspected that the phase transition from Ce4+ to Ce3+ compound accompanied by the oxidation of Sn, i.e. the formation of the mixed Sn–Ce–O oxide from metallic Sn and CeO2 layers may occur at temperatures below 520 K, and here we report experiments performed at 120, 300 and 520 K.

Section snippets

Instruments and methods

All the measurements were performed at the Materials Science Beamline at the Elettra synchrotron light source in Trieste, Italy. The beamline is equipped with a plane grating monochromator providing a synchrotron light beam in the energy range of 40–800 eV, a Specs Phoibos 150 hemispherical electron energy analyzer, a dual-anode X-ray source, LEED optics, cerium and tin evaporators, an ion gun, a sample manipulator allowing cooling/heating of the sample in the range from 120 to 1300 K and a gas

Low temperature, 120 K

First, the 1.5-nm thick CeO2(1 1 1) layer was prepared, cooled to 120 K and carefully checked with LEED, XPS and resonant photoemission. The Ce 3d XPS spectrum is plotted in the bottom part of Fig. 1. It exhibits a typical structure of stoichiometric CeO2 as compared to the literature and confirmed by the fitting procedure described in Section 2.3 (Ce3+ states contribution below 0.1%) and by resonant photoemission (D ratio 0.05), see below. Then, Sn was deposited on the sample in eight steps up to

Conclusions

We have shown that the sample temperature during tin deposition on cerium oxide does not influence the ability of tin to partially reduce CeO2 in the temperature range 120–520 K, that is, the reaction is not activated. The difference lies in the fact that tin diffusion is limited at low temperature. At 120 K tin penetrates only the upper ceria layers and become oxidized by oxygen from ceria. The excess of tin forms a metallic overlayer on the sample surface. At higher temperatures, 300 and 520 K,

Acknowledgements

The authors acknowledge the support of the Ministry of Education of the Czech Republic under Grants No. LC06058 and MSM 0021620834.

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