Residual stress, strain and faults in nanocrystalline palladium and copper
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2017, International Journal of PlasticityCitation Excerpt :However, due to the uncertain surface effect, high KAM differences in austenite were found in DTSSs (Choi et al., 2012b; Herrera et al., 2011) with similar microstructure evolution and mechanical properties. Meanwhile, the dislocation density can be effectively determined using the X-ray diffraction (XRD) based on peak broadening of diffraction patterns (Liang et al., 2016; Sanders et al., 1995; Williamson and Hall, 1953). As the modified Williamson-Hall method (Ungár et al., 1998, 2005; Ungár et al., 1999) assumes that the overall peak broadening includes the strain and size broadening, dislocation contrast factor, the formation of stacking faults and twinning, taking into account that size and strain broadening are diffraction order independent and dependent respectively, the dislocation density can be obtained by the best fitting of fourier coefficient of the strain profile with different diffraction peaks.
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Present address: Materials Science and Engineering Department, Rensselaer Polytechnic Institute, Troy, NY 12180-3590, USA.