XPS and optical absorption studies on α-Al2O3 and MgO single crystals implanted with Cr, Cu, and Kr ions

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Abstract

Charge states of Cu and Cr implanted in α-Al2O3 and MgO were investigated by XPS. Implanted ions are trapped at low concentration of the implants as cations (Cu2+ and Cr3+), except for Cu ion implantation in α-Al2O3. It was implied that isolated Cr atoms and a portion of dimers are trapped as Cr3+ in α-Al2O3, while isolated atoms, dimers, and trimers are trapped as Cr3+ in MgO. Optical absorption measurements showed the presence of lattice defects such as F (or F+) centers, V centers, and F2 centers in implanted MgO crystals.

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