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Preparation and microstructure characterization of a nano-sized Ti4+-doped AgSnO2 electrical contact material

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Abstract

A Ti4+-doped nano-structured AgSnO2 material was prepared using sol-gel method and characterized by X-ray diffraction (XRD), transmission electron microscopy (TEM), and scanning electron microscopy (SEM). The results show that Ti4+ cations are successfully doped into the crystal lattice of SnO2, and thus significantly improve the electrical conductivity of the sample. Furthermore, the coating of Ag on Ti4+-doped SnO2 nano-sized particles enhances the surface wettability and enables the resulting AgSnO2 material to have better mechanical properties.

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Authors and Affiliations

  1. Tianjin Key Laboratory of Composite and Functional Materials, School of Materials Science and Engineering, Tianjin University, Tianjin, 300072, China

    Ji Zheng, Songlin Li, Fuqi Dou & Tonghui Li

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  1. Ji Zheng
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  2. Songlin Li
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  3. Fuqi Dou
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  4. Tonghui Li
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Correspondence to Ji Zheng.

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Zheng, J., Li, S., Dou, F. et al. Preparation and microstructure characterization of a nano-sized Ti4+-doped AgSnO2 electrical contact material. Rare Metals 28, 19–23 (2009). https://doi.org/10.1007/s12598-009-0005-7

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  • DOI: https://doi.org/10.1007/s12598-009-0005-7

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