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A Forward Modeling Approach to High-Reliability Grain Mapping by Laboratory Diffraction Contrast Tomography (LabDCT)

  • Multiscale Computational Strategies for Heterogeneous Materials with Defects: Coupling Modeling with Experiments and Uncertainty Quantification
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Abstract

Laboratory diffraction contrast tomography (LabDCT) is a laboratory-scale x-ray microtomography technique that can be used to non-destructively map grains and grain boundaries in 3D. The fidelity of grain mapping significantly depends on the quality of grain reflections obtained from the illuminated volume of the specimen. In this article, we report the application of a novel forward modeling approach to improve the reliability of grain mapping. Through this approach, a comparison between the obtained grain reflections and simulated grain reflections can be used to perform a self-fitting operation. This can be used to optimize instrumental parameters and iteratively improve the quality of reconstruction. To demonstrate the effectiveness of the forward modeling approach, LabDCT was used to map the grains in a polycrystalline specimen of the magnesium alloy AZ91E and iteratively improve reconstruction quality significantly.

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Acknowledgements

SN, JJW and NC are grateful for financial support from the Office of Naval Research (ONR) through Contracts N00014-10-1-0350 and N00014-16-1-2174 (Dr. W. Mullins and W Nickerson, Program Managers). We gratefully acknowledge the use of facilities within the Center for 4D Materials Science (4DMS) at Arizona State University.

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Authors and Affiliations

  1. Center for 4D Materials Science, Materials Science and Engineering, Arizona State University, 501 E. Tyler Mall, ECG 303, Tempe, AZ, 85287-6106, USA

    Sridhar Niverty, Jason Williams & Nikhilesh Chawla

  2. Xnovo Technology ApS, Theilgaards Alle 9 1.th, 4600, Køge, Denmark

    Jun Sun, Florian Bachmann, Nicolas Gueninchault & Erik Lauridsen

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  1. Sridhar Niverty
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  2. Jun Sun
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  3. Jason Williams
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  5. Nicolas Gueninchault
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  6. Erik Lauridsen
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  7. Nikhilesh Chawla
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Correspondence to Nikhilesh Chawla.

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Niverty, S., Sun, J., Williams, J. et al. A Forward Modeling Approach to High-Reliability Grain Mapping by Laboratory Diffraction Contrast Tomography (LabDCT). JOM 71, 2695–2704 (2019). https://doi.org/10.1007/s11837-019-03538-0

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