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Microstructure-Based Counterfeit Detection in Metal Part Manufacturing

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Abstract

Counterfeiting in metal part manufacturing has become a major global concern. Although significant effort has been made in detecting the implementation of such counterfeits, modern approaches suffer from high expense during production, invasiveness during manufacture, and unreliability in practice if parts are damaged during use. In this paper, a practical microstructure-based counterfeit detection methodology is proposed, which draws on inherent randomness present in the microstructure as a result of the manufacturing process. An optical Physically Unclonable Function (PUF) protocol is developed which takes a micrograph as input and outputs a compact, unique string representation of the micrograph. The uniqueness of the outputs and their robustness to moderate wear and tear is demonstrated by application of the methodology to brass samples. The protocol is shown to have good discriminatory power even between samples manufactured in the same batch, and runs on the order of several seconds per part on inexpensive machines.

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Acknowledgements

Portions of this work were supported by National Science Foundation Grants CPS-1329979, CNS-0915436, CMMI-1265622; and by sponsors of CERIAS. The authors declare that they have no conflict of interest.

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Authors and Affiliations

  1. Purdue University, West Lafayette, IN, 47907, USA

    Adam Dachowicz, Siva Chaitanya Chaduvula, Mikhail Atallah & Jitesh H. Panchal

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  1. Adam Dachowicz
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  2. Siva Chaitanya Chaduvula
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  3. Mikhail Atallah
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  4. Jitesh H. Panchal
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Corresponding author

Correspondence to Adam Dachowicz.

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Dachowicz, A., Chaduvula, S.C., Atallah, M. et al. Microstructure-Based Counterfeit Detection in Metal Part Manufacturing. JOM 69, 2390–2396 (2017). https://doi.org/10.1007/s11837-017-2502-8

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  • DOI: https://doi.org/10.1007/s11837-017-2502-8

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