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Interfacial Reactions in Lead-Free Solder/Cu-2.0Be (Alloy 25) Couples

  • TMS2020 Microelectronic Packaging, Interconnect, and Pb-free Solder
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Abstract

The interfacial reactions between lead-free solders Sn, Sn-3.0 wt.% Ag-0.5 wt.% Cu (SAC) and Sn-9 wt.% Zn (SZ), and Cu-2.0 wt.% Be (Alloy 25) were investigated using the liquid/solid couple technique. The couples were reacted at 240–270°C for 0.5–10 h. The results revealed that only the scallop-shaped (Cu, Be)6Sn5 phase was formed at 240°C for 0.5–2 h in the Sn/Alloy 25 couple. At a longer time (> 4 h) or higher temperature (255°C and 270°C), the (Cu, Be)3Sn phase was observed at the interface. In the SAC/Alloy 25 couple, the results were similar to that in the Sn/Alloy 25 couples. Only the scallop-shaped (Cu, Be, Ag)6Sn5 phase was formed for the short reaction time or at lower reaction temperature. With increasing reaction times and temperatures, both the (Cu, Be, Ag)6Sn5 and (Cu, Be, Ag)3Sn phases were observed at the SAC/Alloy 25 interface. In the SZ/Alloy 25 couple, the (Cu, Sn)Zn5 and (Cu, Sn)5Zn8 phases were observed. Of these three couples, the intermetallic compound (IMC) thickness obeyed the parabolic law, and the IMC growth mechanism was diffusion-controlled.

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Acknowledgments

The authors acknowledge the financial support from the Ministry of Science and Technology, Taiwan, R.O.C. (MOST 108-2221-E-011-091), the Applied Research Center for Thin-Film Metallic Glass from The Featured Areas Research Center Program within the framework of the Higher Education Sprout Project by the Ministry of Education (MOE) in Taiwan. The author is also thankful for the help from Mr. S. C. Laiw who works at the National Taiwan University of Science and Technology for the SEM–EDS operation, Mr. C. Y. Kao who works at the National Taiwan University, and Miss Tsai who works at the National Tsing Hua University for carrying out the EPMA analysis.

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Li, YC., Chang, CH., Pasana, A.S. et al. Interfacial Reactions in Lead-Free Solder/Cu-2.0Be (Alloy 25) Couples. J. Electron. Mater. 50, 903–913 (2021). https://doi.org/10.1007/s11664-020-08693-8

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  • DOI: https://doi.org/10.1007/s11664-020-08693-8

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