Abstract
The interface between multi-walled carbon nanotubes and semiconductor material has important application in electronic and optoelectronic devices. This paper reports the Schottky diode characteristic of multi-walled carbon nanotube/zinc oxide (MWCNT/ZnO) interface. The ideality factor of the MWCNT/ZnO Schottky diode is 2.24 and the Schottky barrier height is 0.534 eV. A dramatic change in non-linear behaviour of the Schottky barrier interface is observed after annealing. The measured current–voltage characteristic shows rectifying behavior of ZnO-MWCNTs interface with an on-to-off ratio of 100.
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Acknowledgements
The Malaviya National Institute of Technology (MNIT), Jaipur, is acknowledged for the support of the Materials Research Centre (MRC) in synthesis of CNTs using the TCVD method. The SEM, Raman and XRD characterizations were performed, and the I–V characteristic determined, at the MRC Lab, MNIT, Jaipur.
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Sharma, A.K., Sharma, R. Fabrication and Characterization of Zinc Oxide/Multi-walled Carbon Nanotube Schottky Barrier Diodes. J. Electron. Mater. 47, 3037–3044 (2018). https://doi.org/10.1007/s11664-018-6170-4
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DOI: https://doi.org/10.1007/s11664-018-6170-4