Abstract
Films of CuInSe2 (CIS) and CuGaSe2 (CGS) were deposited on (100) Si by radiofrequency (RF) magnetron sputtering from stoichiometric CIS and CGS targets. Rutherford backscattering (RBS) analysis yielded a composition of Cu0.8In1.1Se1.9 for CuInSe2, which indicates that these films were Cu and Se poor. A composition of Cu0.3Ga1.5Se2.0 for CuGaSe2 shows Ga-rich and Cu-poor layers. Transmission electron microscopy (TEM) of cross-sectional samples established that the films were polycrystalline in nature and free of pinhole defects that normally short-circuit devices fabricated on glass with submicron absorber layers. From the electron and x-ray diffraction patterns, tetragonal chalcopyrite phases of the material were identified. Circular diodes, with a diameter between 100 μm and 400 μm, were fabricated on the grown films with a common Au back-contact. Diodes on both CIS and CGS films exhibited rectifying characteristics. From the polarity corresponding to the high and low currents, it was inferred that the grown films were p-type. These diodes exhibited photovoltaic response, and the forward-bias current increased by as much as two orders of magnitude when illuminated by a 75-W halogen lamp. The open-circuit voltages (V OC) for these devices are expected to approach the turn-on voltage of the diodes, 0.5 V and 0.7 V, for the CGS/Si and the CIS/Si heterojunctions, respectively. Shunting caused by degenerate phases present in the CGS film is believed to have resulted in the observed lower turn-on voltage for the CGS/n-Si heterojunction diode.
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Akpa, O., Shoieb, S., Thompson, T. et al. Chalcopyrite/Si Heterojunctions for Photovoltaic Applications. J. Electron. Mater. 39, 2462–2466 (2010). https://doi.org/10.1007/s11664-010-1365-3
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DOI: https://doi.org/10.1007/s11664-010-1365-3