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Resonant TE Transmission Through a Continuous Metal Film: Perspectives for Low-Loss Plasmonic Elements

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Abstract

Whereas resonant transverse magnetic transmission across an undulated continuous metal film is achieved with the mediation of plasmon modes excited by the undulation, it is shown here that transverse electric (TE) resonant transmission through a continuous metal film can also be achieved with the mediation of the second-order TE1 mode of a dielectric slab waveguide having the metal film sandwiched at its middle. The demonstration is made by using the materials currently used in the domain of optical security and counterfeit deterrence: ZnS is shown to possibly be a lossless interface/adhesion layer between a polymer and a noble metal for plasmonic resonant elements.

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Acknowledgments

The authors of the French laboratories are very grateful to their colleagues of the ISSP Institute of Solid State Physics of the Bulgarian Academy of Sciences for their expertise in layer deposition and for supplying a number of characterized and optimized resonant structures.

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Authors and Affiliations

  1. Laboratoire H. Curien UMR CNRS 5516, Lyon University, F-42000, Saint-Etienne, France

    S. Tonchev & O. Parriaux

  2. Institute of Solid State Physics, Bulgarian Academy of Sciences, 1784, Sofia, Bulgaria

    S. Tonchev, T. Tenev & I. Miloushev

  3. IEMN UMR CNRS 8520, Avenue Poincaré, 59652, Villeneuve d’Ascq, France

    D. Troadec

  4. LPN UPR CNRS 20, Route de Nozay, 91460, Marcoussis, France

    G. Patriarche

Authors
  1. S. Tonchev
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  2. O. Parriaux
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  3. T. Tenev
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  4. I. Miloushev
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  5. D. Troadec
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  6. G. Patriarche
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Corresponding author

Correspondence to O. Parriaux.

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Tonchev, S., Parriaux, O., Tenev, T. et al. Resonant TE Transmission Through a Continuous Metal Film: Perspectives for Low-Loss Plasmonic Elements. Plasmonics 8, 829–833 (2013). https://doi.org/10.1007/s11468-013-9479-0

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  • DOI: https://doi.org/10.1007/s11468-013-9479-0

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