Abstract
The charge-doping effect on the geometric and the electronic structures of organosilicon oligomers nSi x (C=C) + y has been studied using density functional theory. Charge-doping can significantly lower the excitation energies. Interchain hole hopping mainly occurs between the π-conjugated units. A doped nSi x (C=C) + y oligomer can undergo a structural rearrangement. The simulated UV/vis absorption peak of the rearranged structure is located at higher energy than the non-rearranged one. The hole transfer rate is significantly decreased if a doped molecule undergoes a rearrangement. These results offer a basis to explain previously observed experimental phenomena.
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Yang, L., Shang, Y., Zhang, H. et al. Charge doping effect on σ-π conjugated copolymers. Sci. China Chem. 54, 975–984 (2011). https://doi.org/10.1007/s11426-011-4252-8
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DOI: https://doi.org/10.1007/s11426-011-4252-8