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Quantitative trait loci for resistance to spot blotch caused by Bipolaris sorokiniana in wheat (T. aestivum L.) lines ‘Ning 8201’ and ‘Chirya 3’

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Abstract

Spot blotch caused by Bipolaris sorokiniana is a destructive disease of wheat in warm and humid wheat growing regions of the world. To identify quantitative trait loci (QTLs) for spot blotch resistance, two mapping populations were developed by making the crosses between common susceptible cultivar ‘Sonalika’ with the resistant breeding lines ‘Ning 8201’ and ‘Chirya 3’. Single seed descent derived F6, F7, F8 lines of the first cross ‘Ning 8201’ × ‘Sonalika’ were evaluated for resistance to spot blotch in three blocks in each of the 3 years. After screening of 388 pairs of simple sequence repeat primers between the two parents, 119 polymorphic markers were used to genotype the mapping population. Four QTLs were identified on the chromosomes 2AS, 2BS, 5BL and 7DS and explained 62.9% of phenotypic variation in a simultaneous fit. The QTL on chromosome 2A was detected only in 1 year and explained 22.7% of phenotypic variation. In the second cross (‘Chirya 3’ × ‘Sonalika’), F7 and F8 population were evaluated in three blocks in each of the 2 years. In this population, five QTLs were identified on chromosomes 2BS, 2DS, 3BS, 7BS and 7DS. The QTLs identified in the ‘Chirya 3’ × ‘Sonalika’ population explained 43.4% of phenotypic variation in a simultaneous fit. The alleles for reduced disease severity in both the populations were derived from the respective resistant parent. The QTLs QSb.bhu-2B and QSb.bhu-7D from both populations were placed in the same deletion bins, 2BS1-0.53-0.75 and 7DS5-0.36-0.61, respectively. The closely linked markers Xgwm148 to the QTL on chromosome 2B and Xgwm111 to the QTL on chromosome 7D are potentially diagnostic markers for spot blotch resistance.

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Abbreviations

QTL:

Quantitative trait loci

SSD:

Single seed descent

SSR:

Simple sequence repeat

PCR:

Polymerase chain reaction

GS:

Growth stage

AUDPC:

Area under disease progress curve

LOD:

Likelihood of odds ratio

Ltn:

Leaf tip necrosis

GWM:

Gatersleben wheat microsatellite

SWM:

Swiss wheat microsatellite

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Acknowledgments

This research was supported by a DAAD-Leibniz (German Academic Exchange Service) fellowship to U. Kumar. Initial work on RILs was supported by the Council of Scientific and Industrial Research, New Delhi. Authors are thankful to Ram Awadh, Anette Heber and Sonja Allner for excellent technical assistance.

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Author notes

  1. U. Kumar

    Present address: The Energy and Resources Institute, IHC Complex, Lodhi Road, New Delhi, 110003, India

  2. A. K. Joshi

    Present address: CIMMYT, South Asia Regional Office, P.O. Box 5186, Kathmandu, Nepal

Authors and Affiliations

  1. Leibniz Institute of Plant Genetics and Crop Plant Research (IPK), Corrensstr. 3, 06466, Gatersleben, Germany

    U. Kumar & M. S. Röder

  2. Department of Genetics and Plant Breeding, Institute of Agricultural Sciences, Banaras Hindu University, Varanasi, 221005, India

    A. K. Joshi

  3. Department of Molecular Biology and Genetic Engineering, Sardar Vallabh Bhai Patel University of Agriculture and Technology, Meerut, 250110, India

    S. Kumar

  4. Department of Mycology and Plant Pathology, Institute of Agricultural Sciences, Banaras Hindu University, Varanasi, 221005, India

    R. Chand

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Correspondence to U. Kumar.

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Kumar, U., Joshi, A.K., Kumar, S. et al. Quantitative trait loci for resistance to spot blotch caused by Bipolaris sorokiniana in wheat (T. aestivum L.) lines ‘Ning 8201’ and ‘Chirya 3’. Mol Breeding 26, 477–491 (2010). https://doi.org/10.1007/s11032-009-9388-2

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