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Luminance degradation test and life prediction of LED light at conventional stress using TPWRAM

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Abstract

With the rapid development of the light emitting diode (LED) industry, the issue of its life has also attracted significant attention. How to accurately and quickly obtain the conventional life of LED light has become an urgent problem to be solved in recent years. In this work, a life test based on conventional stress was carried out to gain the average luminance degradation data for samples with time, and then set up life prediction model based on three-parameter Weibull function and right approximation method to process test data. The average life of the samples was calculated in combination with the failure criteria, and the life prediction of LED light was achieved. The results indicate that the average luminance degradation data obtained by the life test under conventional stress basically shows a nonlinear decay trend, which is in line with the luminance degradation law of general optoelectronic devices. The determination coefficient for the fitted curve of three-parameter Weibull right approximation method (TPWRAM) is 0.9994, which is very close to 1, indicating that the method has a high level of fitting accuracy. The mean relative error of average luminance degradation data under conventional stress is 0.559%, demonstrating that TPWRAM has high accuracy in predicting the conventional life of LED light. The average life of the samples was deduced, which can be used to verify the effectiveness of the assumptions proposed in the accelerated degradation test and provide crucial guidance for LED light production.

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Data availability

The datasets generated during and/or analyzed during the current study are available from the corresponding author on reasonable request.

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Acknowledgements

This work is sponsored by the Program of Foundation of Science and Technology Commission of Shanghai Municipality (22dz1206005, 22dz1204202), National Natural Science Foundation of China (12172228, 11572187), Natural Science Foundation of Shanghai (22ZR1444400), and Shanghai Professional Technical Service Platform for Intelligent Operation and Maintenance of Renewable Energy (22DZ2291800).

Funding

Funding was provided by Science and Technology Commission of Shanghai Municipality (Grant Nos. 22dz1206005, 22dz1204202), National Natural Science Foundation of China (Grant Nos. 12172228, 11572187), Natural Science Foundation of Shanghai (Grant No. 22ZR1444400) and Shanghai Professional Technical Service Platform for Intelligent Operation and Maintenance of Renewable Energy (Grant No. 22DZ2291800).

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Authors and Affiliations

  1. College of Mechanical Engineering, University of Shanghai for Science and Technology, Shanghai, 200093, China

    Jianping Zhang & Yuying Zhang

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  1. Jianping Zhang
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  2. Yuying Zhang
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Contributions

All authors contributed to the study conception and design. Conceptualization, methodology, supervision, project administration, funding acquisition, resources were performed by ZJ. Methodology, data curation, writing-original draft & editing were finished by ZY, and all authors commented on previous versions of the manuscript. All authors read and approved the final manuscript.

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Correspondence to Jianping Zhang.

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Zhang, J., Zhang, Y. Luminance degradation test and life prediction of LED light at conventional stress using TPWRAM. J Mater Sci: Mater Electron 34, 2197 (2023). https://doi.org/10.1007/s10854-023-11531-2

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