Abstract
ZnO: Al thin films were deposited by spray pyrolysis onto glass substrates with 0, 0.5, 1.0, 2.0, 5.0 and 10.0% [Al3+/Zn2+] ratios in the deposition solution. Films were characterized by scanning electron microscopy, energy dispersive X-ray spectroscopy, X-ray diffraction, UV–vis transmittance, conductive atomic force microscopy and the sheet resistance was measured. Aluminum contents in the films increases with the Al3+/Zn2+ ratio in the bath while the film deposition rate decreases due to the lower Al3+ surface mobility. Films were crystalline and display a varied morphology that evolves from flakes to mixtures between flakes and pencils and finally between triangles and hexagonal columns with increasing Al contents. Al3+ inclusion at the different sites within the ZnO lattice is proposed to direct the crystal habit and therefore the observed morphology and film texture. The optical band gap evolution and carrier density are related by the Burstein-Moss effect. The results show that film texture influences carrier mobility: increased presence of (112) planes originate a mobility increase while a predominant (110) or (100) texture reduces it. By Current sensing Atomic Force Microscopy (CAFM) the local surface current distribution was related with the observed film texture.
References
M. Fallah, M.R. Zamani-Meymian, R. Rahimi, M. Rabbani, Appl. Surf. Sci. 316, 456 (2014)
H. Scherg-Kurmes, S. Seeger, S. Körner, B. Rech, R. Schlatmann, B. Szyszka, Thin Solid Films 599, 78 (2016)
B. Kumar, S.-W. Kim, Nano Energy 1, 342 (2012)
A. Wei, L. Pan, W. Huang, Mater. Sci. Eng. 176, 1409 (2011)
D.J. Rogers, V.E. Sandana, S. Gautier, T. Moudakir, M. Abid, A. Ougazzaden, F.H. Teherani, P. Bove, M. Molinari, M. Troyon, M. Peres, M.J. Soares, A.J. Neves, T. Monteiro, D. McGrouther, J.N. Chapman, H.J. Drouhin, R. McClintock, M. Razeghi, Nano. Fund. Appl. 15, 53 (2015)
S. Tabassum, E. Yamasue, H. Okumura, K.N. Ishihara, Appl. Surf. Sci. 377, 355 (2016)
Y. Yamada, K. Kadowaki, H. Kikuchi, S. Funaki, S. Kubo, Thin Solid Films 609, 25 (2016)
A. Tubtimtae, M.-W. Lee, Superlatt. Microstruct. 52, 987 (2012)
J.K. Jeong, H.J. Yun, S.D. Yang, K.Y. Eom, S.W. Chea, J.H. Park, H.D. Lee, G.W. Lee, Thin Solid Films 638, 89–95 (2017)
D.J. Edison, W. Nirmala, K.D.A. Kumar, S. Valanarasu, V. Ganesh, M. Shkir, S. AlFaify, Phys. B 523, 31–38 (2017)
C.Y. Chi, H.I. Chen, W.C. Chen, C.H. Chang, W.C. Liu, Sens. Actuators B 243, 1248 (2017)
S. Boscarino, G. Torrisi, I. Crupi, A. Alberti, S. Mirabella, F. Ruffino, A. Terrasi, Nuclear Instr. Methods Phys. Res. Section B 392, 14–20 (2017)
L. Dejam, A.A. Shokri, H.H. Nazari, S.M. Elahi, J. Mater. Sci. 28, 9378–9386 (2017)
F. Wang, C. Chang, Appl. Surf. Sci. 370, 83 (2016)
M.S. Al-Assiri, M.M. Mostafa, M.A. Ali, M.M. El-Desoky, Superlatt. Microstruct. 75, 127 (2014)
X. Duan, G. Chen, L. Guo, Y. Zhu, H. Ye, Y. Wu, Superlatt. Microstruct. 88, 501 (2015)
M. Ying, S. Wang, T. Duan, B. Liao, X. Zhang, Z. Mei, X. Du, F.M. Gerriu, A.M. Fox, G.A. Gehring, Mater. Lett. 171, 121 (2016)
Y. Sun, H. Guo, W. Zhang, T. Zhou, Y. Qiu, K. Xu, B. Zhang, H. Yang, Ceram. Int. 42, 9648 (2016)
M. Wang, J. Yi, S. Yang, Z. Cao, X. Huang, Y. Li, H. Li, J. Zhong, Appl. Surf. Sci. 382, 217 (2016)
Y. Aoun, B. Benhaoua, S. Benramache, B. Gasmi, Optik 126, 2481 (2015)
N. Kıcır, T. Tüken, O. Erken, C. Gumus, Y. Ufuktepe, Appl. Surf. Sci. 377, 191 (2016)
X. Fang, J. Li, D. Zhao, B. Li, Z. Zhang, D. Shen, X. Wang, Z. Wei, Thin Solid Films 518, 5687 (2010)
K.M. Fang, Z.Z. Wang, M. Zhang, A.J. Wang, Z.Y. Meng, J.J. Feng, J. Colloid Interface Sci. 402, 68 (2013)
N.T. Son, J.-S. Noh, S. Park, Appl. Surf. Sci. 379, 440 (2016)
G.N. Dar, A. Umar, S.A. Zaidi, S. Baskoutas, S.W. Hwang, M. Abaker, A. Al-Hajry, S.A. Al-Sayari, Talanta 89, 155 (2012)
M. Salavati-Niasari, N. Mir, F. Davar, J. Alloys Compd. 476, 908 (2009)
A.W. Metz, J.R. Ireland, J.-G. Zheng, R.P.S.M. Lobo, Y. Yang, J. Ni, C.L. Stern, V.P. Dravid, N. Bontemps, C.R. Kannewurf, K.R. Poeppelmeier, T.J. Marks, J. Am. Chem. Soc. 126, 8477 (2004)
J.T. Wang, X.L. Shi, W.W. Liu, X.H. Zhong, J.N. Wang, L. Pyrah, K.D. Sanderson, P.M. Ramsey, M. Hirata, K. Tsuri, Sci. Rep. 4, 3679 (2014)
C.F. Yu, S.H. Chen, W.J. Xie, Y.S. Lin, C.Y. Shen, S.J. Tsai, C.W. Sung, C. Ay, Microsc. Res. Technol. 71, 1 (2008)
J.A. Barón-Miranda, O. Calzadilla, L.E. Arvizu-Rodríguez, J.L. Fernández-Muñoz, C. Guarneros-Aguilar, F.F. Chale-Lara, U. Páramo-García, F. Caballero-Briones, Coatings 6, 71 (2016)
F. Caballero-Briones, A. Palacios-Padrós, O. Calzadilla, F. Sanz, Electrochim. Acta 55, 4353 (2010)
R. Horcas, J.M. Fernandez, J. Gomez-Rodriguez, J. Colchero, A.M. Gomez-Herrero, Baro, Rev. Sci. Instrum. 78, 013705 (2007)
A. Henni, A. Merrouche, L. Telli, A. Karar, J. Electroanalytical. Chem. 763, 149 (2016)
A. Crossay, S. Buecheler, L. Kranz, J. Perrenoud, C.M. Fella, Y.E. Romanyuk, A.N. Tiwari, Solar Energy Mater. Solar Cells 101, 283 (2012)
S. Gledhill, A. Grimm, D. Greiner, W. Bohne, M. Lux-Steiner, C.-H. Fischer, Thin Solid Films 519, 4293 (2011)
E. Pereira da Silva, M. Chaves, G. Junior da Silva, L. Baldo de Arruda, P.N. Lisboa-Filho, S.F. Durrant, J.R.R. Bortoleto, Mater. Sci. Appl. 04, 761 (2013)
E. Chan y Díaz, R. Castro-Rodríguez, I. Perez-Quintana, M. Acosta, J. Méndez-Gamboa, R.A. Medina-Esquivel, C. Acosta, A. Iribarren, J. Mater. Sci. (2017)
F. Gracia, J.P. Holgado, A.R. Gonzalez-Elipe, Langmuir 20, 1688 (2004)
W. Li, E. Shi, W. Zhong, Z. Yin, J. Cryst. Growth 203, 186 (1999)
R. Amiruddin, S. Devasia, D.K. Mohammedali, M.C. Santhosh Kumar, Semicond. Sci. Technol. 30, 035009 (2015)
X. Zhou, Z.X. Xie, Z.Y. Jiang, Q. Kuang, S.H. Zhang, T. Xu, R.B. Huang, L.S. Zheng, Chem. Commun. 44, 5572 (2005)
Y. Zhang, G. Du, D. Liu, X. Wang, Y. Ma, J. Wang, J. Yin, X. Yang, X. Hou, S. Yang, J. Cryst. Growth 243, 439 (2002)
L. Qi, M.B. Shahzad, Y. Qi, CrystEngComm 18, 6573 (2016)
Z. Deng, C. Huang, J. Huang, M. Wang, H. He, H. Wang, Y. Cao, J. Mater. Sci. 21, 1030 (2010)
K. Elmer, A. Klein, B. Rench, Transparent conductive zinc oxide. (Springer, Berlin, 2008)
S. Pat, R. Mohammadigharehbagh, S. Özen, V. Şenay, H.H. Yudar, Ş. Korkmaz, Vacuum 141, 210–215 (2017)
A.C. Aragonès, A. Palacios-Padrós, F. Caballero-Briones, F. Sanz, Electrochim. Acta 109, 117 (2013)
V. Srikant, D.R. Clarke, J. Appl. Phys. 83, 5447 (1998)
H. Serier, M. Gaudon, M. Ménétrier, Solid State Sci. 11, 1192 (2009)
A. Janotti, C.G. Van de Walle, Rep. Prog. Phys. 72, 126501 (2009)
L. Tiburcio-Silver, Castañeda, J. Phys. D: Appl. Phys. 41, 228001 (2008)
Acknowledgements
FCB thanks the financial support of SIP-IPN 2016-1804 multidisciplinary project as well as EDI and SIBE grants from IPN. OCA acknowledges SIP-IP 2016-1804 visiting professor aid. Support from P. Quintana-Owen and W. Cauich at LANNBIO-Merida (CONACYT Grants FOMIX-Yucatan 2008-108160 and LAB-2009-01 123913) for SEM/EDS is kindly recognized.
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Barón-Miranda, J.A., Calzadilla, O., San-Juan-Hernández, S. et al. Influence of texture on the electrical properties of Al-doped ZnO films prepared by ultrasonic spray pyrolysis. J Mater Sci: Mater Electron 29, 2016–2025 (2018). https://doi.org/10.1007/s10854-017-8113-x
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s10854-017-8113-x