Abstract
The accumulation of irradiation-induced disorder in SrTiO3 single crystals irradiated at 16 K with 200 keV Ar ions has been investigated using Rutherford backscattering spectrometry along the 〈100〉 channeling direction and compared with previous results obtained at 300 K under identical irradiation conditions. As expected, amorphization at 16 K occurs at a much lower fluence than at 300 K due to dynamic recovery of irradiation-induced defects at 300 K. Utilizing a comprehensive damage accumulation model for analysis of the data, irradiation at 16 K results only in the formation of point defects and amorphous pockets, while defect clusters are also formed at 300 K. High defect mobility under irradiation at 300 K tends to promote recombination and clustering of point defects. These results suggest that defect diffusion processes in SrTiO3 are not thermally active at 16 K.
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Acknowledgements
This work was supported by the US Department of Energy, Office of Science, Basic Energy Sciences, Materials Sciences and Engineering Division under Contract Number DE-AC05-00OR22725. The work was also supported by the BMBF of Germany under Contract Number 03SF0478B. The authors gratefully acknowledge the staff of the ion beam center facility at the Friedrich-Schiller Universität Jena for their assistance during ion irradiation and ion channeling experiments.
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Velişa, G., Wendler, E., Wang, LL. et al. Amorphization kinetics in strontium titanate at 16 and 300 K under argon ion irradiation. J Mater Sci 54, 6066–6072 (2019). https://doi.org/10.1007/s10853-018-03313-7
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DOI: https://doi.org/10.1007/s10853-018-03313-7