Abstract
This article reports the impact of one critical process parameter, the heating rate during sintering from 530 to 850 °C, on the densification of a crystallized low temperature co-fired ceramics (LTCC). At a low heating rate the densification of LTCC is impeded by the competing crystallization processes, resulting in less shrinkage, lower density and consequently lower dielectric constant. Microstructural evidence is provided to analyze the multiple crystalline phases formed during sintering process. It is concluded that an optimized sintering profile should have a heating rate that allows full densification prior to onset of crystallization, follow by a full crystallization to limit the amount of residual glass for enhanced dielectric properties.
Similar content being viewed by others
References
Chen GH, Liu XY (2006) J Mater Sci: Mater Electron 17:877
Nair KM, McCombs MF, Souders KE, Parisi JM, Hang KH, Nair DM, Beers SC (2010) Advances in electroceramic materials II, vol 221. Wiley, Hoboken
951 LTCC data sheet. http://www2.dupont.com/MCM/en_US/tech_info/products/ltcc.html#951
Panda PC, Raj R (1989) J Am Ceram Soc 72:1564
Mohanram A, Messing GL, Green DJ (2005) J Am Ceram Soc 88:2681
Baker-Javis J, Janezic MD, Riddle B, Holloway CL, Paulter NG, Blendell JE (2001) In: Dielectric and conductor-loss characterization and measurements on electronic packaging materials. NIST Technical Note 1520, July 2001
Baker-Javis J, Geyer RG, Grosvenor JH Jr, Janezic MD, Jones CA, Riddle B, Weil CM (1998) IEEE Trans Dielectr Electr Insul 5(4):571
DiAntonio C, Ewsuk K (2010) In: Fang ZZ (ed) Sintering of advanced materials. Woodhead Publishing, Cambridge, p 130
9k7 LTCC data sheet. http://www2.dupont.com/MCM/en_US/products/greentape_9K7.html
Kotula PG, Keenan MR, Michael JR (2003) Microsc Microanal 9:1
Acknowledgements
The author thanks Dr Ping Lu for TEM analysis, Dr Mark Rodriguez for XRD work, Bonnie Mckenzie for SEM characterization, Tom Chavez and Dennis De Smet for help in sample fabrication and measurement, and Dr Kevin Ewsuk for his critical review of the manuscript. The author also would like to thank Mr Deepukumar M. Nair of DuPont Microelectronic Materials for validation measurement of dielectric constants and quality factors. Sandia National Laboratories is a multi-program laboratory managed and operated by Sandia Corporation, a wholly owned subsidiary of Lockheed Martin Corporation, for the U.S. Department of Energy’s National Nuclear Security Administration under contract DE-AC04-94AL85000.
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Dai, S. Densification and crystallization in crystallizable low temperature co-fired ceramics. J Mater Sci 47, 4579–4584 (2012). https://doi.org/10.1007/s10853-012-6318-1
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s10853-012-6318-1