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Probe Reflection and Transmission Based Atomic Microscopy

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Abstract

The precise position measurement of atoms using reflection and transmission beams of light is studied in this manuscript. It is reported that the transmission and reflection of probe light can be used to detect the localized position of atoms in one dimension which exhibit high resolution and varying number of peaks. Notably, sharp peaks of localization are reported in the transmission and reflection spectra, within the half-wavelength domain. Remarkably, the localized peaks undergo a shift from one half-wavelength domain to another when the sign of the phase in the standing wave field is altered. The theoretical results obtained for atom microscopy in the reflection and transmission spectra hold promising applications in advanced laser cooling technology.

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Authors and Affiliations

  1. School of Physical Science and Technology, Soochow University, Suzhou Jiangsu, 215006, China

    Majid Khan, Zakir Khan & Aizaz Khan

  2. Department of Physics, Abdul Wali Khan University Mardan, Mardan, 23200, Pakistan

    Muhammad Nafees

  3. Department of Physics, Government Degree College, Gulabad Dir(L), Gulabad, Pakistan

    Muhammad Nafees & Aizaz Khan

  4. Department of Physics, Hazara University, Mansehra, Pakistan

    Muhammad Haneef

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  1. Majid Khan
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  2. Zakir Khan
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  3. Muhammad Nafees
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  4. Aizaz Khan
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Contributions

Calculations and Simulations: Majid Khan and Zakir Khan. Writing Original Draft: Majid Khan, Zakir Khan, Muhammad Nafees and Aizaz Khan. Conceptualization and Supervision: Muhammad Haneef.

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Correspondence to Zakir Khan.

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Khan, M., Khan, Z., Nafees, M. et al. Probe Reflection and Transmission Based Atomic Microscopy. Int J Theor Phys 62, 238 (2023). https://doi.org/10.1007/s10773-023-05496-5

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