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Intercomparison of Terahertz Dielectric Measurements Using Vector Network Analyzer and Time-Domain Spectrometer

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Abstract

We describe a method for direct intercomparison of terahertz permittivities at 200 GHz obtained by a Vector Network Analyzer and a Time-Domain Spectrometer, whereby both instruments operate in their customary configurations, i.e., the VNA in waveguide and TDS in free-space. The method employs material that can be inserted into a waveguide for VNA measurements or contained in a cell for TDS measurements. The intercomparison experiments were performed using two materials: petroleum jelly and a mixture of petroleum jelly with carbon powder. The obtained values of complex permittivities were similar within the measurement uncertainty. An intercomparison between VNA and TDS measurements is of importance because the two modalities are customarily employed separately and require different approaches. Since material permittivities can and have been measured using either platform, it is necessary to ascertain that the obtained data is similar in both cases.

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Notes

  1. This value of reflection actually corresponds to a height and width tolerance of 6.5 μm. However, this value is used here as it will provide a somewhat conservative estimate of the actual reflection produced by the waveguide apertures.

  2. This is the IEEE 1785.2a ‘precision pin’ flange design described in [28].

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Acknowledgments

This work was supported by the National Measurement Office of the UK.

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Correspondence to Mira Naftaly.

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Naftaly, M., Shoaib, N., Stokes, D. et al. Intercomparison of Terahertz Dielectric Measurements Using Vector Network Analyzer and Time-Domain Spectrometer. J Infrared Milli Terahz Waves 37, 691–702 (2016). https://doi.org/10.1007/s10762-016-0256-y

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