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An improved 1.8 V 4.05 ppm/°C curvature corrected bandgap reference circuit

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Abstract

In this paper a curvature corrected bandgap reference circuit is presented which uses folded cascode operation amplifier using beta multiplier as a constant current source. It consists of PTAT current generation circuit and CTAT current generation circuit as two major subparts. The proposed design produces reference voltage of 701.78 mV with temperature coefficient of 4.05 ppm/°C for the temperature range of – 40 to 125 °C.The value of power consumed by the circuit is 86.135 µW at 1.8 V supply voltage. For proposed design the value of power supply rejection ratio is − 60.53 dB for frequency range of 100 Hz to 100 kHz. All simulation results are obtained in cadence virtuoso using SCL 180 nm CMOS technology.

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Authors and Affiliations

  1. Department of Electronics & Communication Engineering, Indira Gandhi Delhi Technical University for Women, Delhi, 110006, India

    Anushree & Jasdeep Kaur

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  1. Anushree
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  2. Jasdeep Kaur
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Contributions

Both the authors Anushree and Jasdeep Kaur contributed to the study of concept and methodology. Formal analysis and investigation is performed by Anushree. The original draft is prepared by Anushree under the supervision of Jasdeep Kaur. Initial manuscript is reviewed by Anushree and finally by Jasdeep Kaur and all the editing work is done by Anushree. All the resources used to perform this research are arranged by Jasdeep Kaur. Although, after completion of final manuscript both the authors read it thoroughly, incorporated the required changes and approved the final manuscript.

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Correspondence to Anushree.

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Financial interests: Authors Anushree and Jasdeep Kaur declare they have no financial interests. Non-financial interests: Author Anushree is writing this manuscript for educational purpose under the supervision of co-author Jasdeep Kaur.

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Anushree, Kaur, J. An improved 1.8 V 4.05 ppm/°C curvature corrected bandgap reference circuit. Analog Integr Circ Sig Process 118, 239–246 (2024). https://doi.org/10.1007/s10470-023-02234-z

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  • DOI: https://doi.org/10.1007/s10470-023-02234-z

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