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An analysis of high-frequency noise in RF active CMOS mixers

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Abstract

An analysis of high-frequency noise in RF active CMOS mixers including single-balanced and double-balanced architectures is presented. The analysis investigates the contribution of non-white gate-induced noise to the output noise power as well as the spot noise figure (NF) of the RF CMOS mixer. It accounts for the non-zero correlation between the gate-induced noise and the channel’s thermal noise. The noise contribution of the RF transconductor and the switching pair to the output noise power is studied. Experimental results verify the accuracy of the analytical model.

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Authors and Affiliations

  1. Department of EECS, University of California, Irvine, Irvine, 92697-2625

    Payam Heydari

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  1. Payam Heydari
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Payam Heydari (S’98–M’00) received the B.S. and M.S. degrees in electrical engineering from the Sharif University of Technology, in 1992, 1995, respectively. He received the Ph.D. degree in electrical engineering from the University of Southern California, in 2001.

During the summer of 1997, he was with Bell-Labs, Lucent Technologies, where he worked on noise analysis in deep submicrometer very large-scale integrated (VLSI) circuits. During the summer of 1998, he was with IBM T. J. Watson Research Center, Yorktown Heights, NY, where he worked on gradient-based optimization and sensitivity analysis of custom-integrated circuits. Since August 2001, he has been an Assistant Professor of Electrical Engineering at the University of California, Irvine, where his research interest is the design of high-speed analog, RF, and mixed-signal integrated circuits.

Dr. Heydari has received the 2005 National Science Foundation (NSF) CAREER Award, the 2005 IEEE Circuits and Systems Society Darlington Award, the 2005 Henry Samueli School of Engineering Teaching Excellence Award, the Best Paper Award at the 2000 IEEE International Conference on Computer Design (ICCD), the 2000 Honorable Mention Award from the Department of EE-Systems at the University of Southern California, and the 2001 Technical Excellence Award in the area of Electrical Engineering from the Association of Professors and Scholars of Iranian Heritage (APSIH). He was recognized as the 2004 Outstanding Faculty at the EECS Department of the University of California, Irvine. His name was included in the 2006 Who’s Who in America.

Dr. Heydari Professor Heydari has been the Associate Editor of IEEE TRANS. ON CIRCUITS AND SYSTEMS, I, since 2006. He currently serves on the Technical Program Committees of International Symposium on Low-Power Electronics and Design (ISLPED), International Symposium on Quality Electronic Design (ISQED), and the Local Arrangement Chair of the ISLPED conference. He was the Student Design Contest Judge for the DAC/ISSCC Design Contest Award in 2003, the Technical Program Committee member of the IEEE Design and Test in Europe (DATE) from 2003 to 2004, and International Symposium on Physical Design (ISPD) in 2003.

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Heydari, P. An analysis of high-frequency noise in RF active CMOS mixers. Analog Integr Circ Sig Process 48, 199–209 (2006). https://doi.org/10.1007/s10470-006-7295-6

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  • DOI: https://doi.org/10.1007/s10470-006-7295-6

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