Abstract:
The crystallographic structure of thin Ni films deposited on Cu(001) has been studied using Surface Extended X-ray Absorption Fine Structure (SEXAFS). Taking advantage of the linear polarization of the synchrotron radiation, we have shown that Ni adopts the Cu lattice parameter parallel to the interface. This lateral expansion induces a longitudinal compression of the unit cell, leading to a face centered tetragonal structure of the Ni films from 3 to 10 monolayers. The temperature dependence of the EXAFS oscillations has allowed to measure strain inside the Ni layers.
Similar content being viewed by others
Author information
Authors and Affiliations
Additional information
Received 22 December 1998
About this article
Cite this article
Le Fèvre, P., Magnan, H. & Chandesris, D. Tetragonal structure of thin nickel films on Cu(001). Eur. Phys. J. B 10, 555–562 (1999). https://doi.org/10.1007/s100510050886
Issue Date:
DOI: https://doi.org/10.1007/s100510050886