Abstract
For the first time, the yield strength of thin-film parylene-C is measured from membrane load-deflection experiments and surface profile analysis. To do so, the onset pressure which causes plastic deformation of the membrane is first experimentally measured. Then a new 2-step displacement model, together with the energy minimization technique [1], is developed to convert the onset pressure to the yield strength on the pre-stressed parylene membrane under a uniform pressure loading. The results depict a Yield Strength of 59 MPa (or 0.012 of strain) for thin-film parylene-C in comparison to 55 MPa reported by parylene vendor (measured from large samples) [2]. To double check with the result, the balloon model [3] is further used to compare with the stress value from our model at the center of parylene membranes and good agreements are obtained.
Similar content being viewed by others
Author information
Authors and Affiliations
Corresponding author
Additional information
This work is supported by the NSF Center for Neuromorphic Systems Engineering (CNSE) at Caltech.
Rights and permissions
About this article
Cite this article
Shih, C., Harder, T. & Tai, Y. Yield strength of thin-film parylene-C. Microsystem Technologies 10, 407–411 (2004). https://doi.org/10.1007/s00542-004-0428-x
Received:
Accepted:
Issue Date:
DOI: https://doi.org/10.1007/s00542-004-0428-x