Evanescent wave scattering by aggregates of clusters – application to optical near-field microscopy

Abstract.

Extended Mie-theory is used to investigate scattering and extinction of evanescent waves by aggregates of clusters. In an application to apertureless near-field optical microscopy involving total internal reflection at the surface substrate–air, the variation of the scattered power is calculated when a silicon particle is scanned across single clusters or aggregates of clusters in the evanescent field. Metallic, dielectric, and semiconducting particles are taken into consideration, and the dependence on sizes, materials, and the wavelength is discussed.