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Automatic optical phase identification of micro-drill bits based on improved ASM and bag of shape segment in PCB production

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Abstract

This paper addresses the problem of automatic optical phase identification of micro-drill bits for micro-drilling tool inspection in printed circuit board production. To overcome the limitations of conventional active shape model (ASM) on shape modeling of micro-drill bits, six key landmarks are defined for the initialization and optimization of ASM, and a novel method based on projection profiles is also proposed for these key landmarks detection. In addition, to involve the local shape feature, a bag of shape segment (BoSS) model is developed. Based on the improved ASM and BoSS, a new shape representation of micro-drill bits is proposed for phase identification. Experimental results show that the proposed method outperforms the conventional ASM and can improve the phase identification accuracy of micro-drill bits.

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Acknowledgments

This work was supported in part by Science Fund for Creative Research Groups of National Natural Science Foundation of China (51221004), National Basic Research 973 Program of China (2011CB706503), National Natural Science Foundation of China (51075357), Grant-in-Aid for Scientific Research from the Japanese MEXT (2430076) and the R-GIRO research fund from Ritsumeikan University. The authors would like to thank the companies of Remixpoint and NC Industry.

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Correspondence to Guifang Duan.

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Duan, G., Wang, H., Liu, Z. et al. Automatic optical phase identification of micro-drill bits based on improved ASM and bag of shape segment in PCB production. Machine Vision and Applications 25, 1411–1422 (2014). https://doi.org/10.1007/s00138-014-0627-0

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  • DOI: https://doi.org/10.1007/s00138-014-0627-0

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