Abstract
The creep rate of polycrystalline tin was studied as a function of temperature and stress in constant stress experiments. The temperature was varied from room temperature to almost the melting point of tin. Activation energies were calculated from tests run at the same stress. It was found that on a log creep rate vs inverse temperature plot the experimental points did not fall on one straight line but on a line which changed its slope in the 90° to 160°C region. Two activation energies for the creep of tin can be calculated from the data: ta value around 26,000 cal per mol at high temperatures and a value around 11,000 cal per mol at low temperatures. It is suggested that the discrepancies between the creep activation energies and those of self-diffusion can be accounted for if self-diffusion takes place predominately by Zener’s ring mechanism rather than through vacancy or interstitial movement.
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Discussion of this paper, TP 4015E, may be sent, 2 copies, to AIME by Jan. 1, 1956. Manuscript, Sept. 8, 1954. Philadelphia Meeting, October 1955.
This paper is based on a portion of a thesis by J. E. Breen submitted, in partial fulfillment of the requirements for the degree of Master of Science, to the University of Maryland.
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Breen, J.E., Weertman, J. Creep of Polycrystalline Tin. JOM 7, 1230–1234 (1955). https://doi.org/10.1007/BF03379034
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DOI: https://doi.org/10.1007/BF03379034