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X-ray diffraction study of epitaxial zinc and cadmium films prepared by hot-wall technique

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Abstract

Hot-wall technique greatly improves the quality of zinc and cadmium films deposited on glass substrate. At substrate temperature the growth of such films is well ordered, showing highly preferred orientation along c-axis. However, if the substrate temperature is increased beyond certain limit, we get polycrystalline growth of the films. This shows that the growth of zinc and cadmium films on glass substrate strongly depends on the substrate temperature.

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Kulkarni, A.V., Pratap, R. X-ray diffraction study of epitaxial zinc and cadmium films prepared by hot-wall technique. Bull. Mater. Sci. 8, 449–452 (1986). https://doi.org/10.1007/BF02744109

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  • DOI: https://doi.org/10.1007/BF02744109

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