Abstract
A new opto-electronic strain meter is described. This instrument can be used to record tensile load-extension and elastic aftereffect diagrams for film microspecimens at a maximum elongation rate of 1 mm/sec and a resolution of 1.5µ.
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Literature cited
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Additional information
Moscow Branch, Institute of Chemical Physics, Academy of Sciences of the USSR. Translated from Mekhanika Polimerov, No. 6, pp. 1110–1111, November–December, 1969.
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Gal'perin, L.N., Zabrodin, V.A., Kirillov, P.K. et al. Opto-electronic strain meter. Polymer Mechanics 5, 994–995 (1969). https://doi.org/10.1007/BF00864685
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DOI: https://doi.org/10.1007/BF00864685