Abstract
We make up a novel and simple theory for near field and near-field optical microscopy (NOM). Our theory is composed of two parts. The first is a formulation to calculate the scattered near field of light by a small dielectric. We state that a wavenumber-vector-independent picture appears in the theory of the near field, and we find that this is expressed by an Ampere-like law for the displacement vector field. The second part is a formulation of field intensity for far field observation and near field observation from a unified point of view. We suggest a theoretical formula for the field intensity corresponding to the NOM image and demonstrate how to understand the relation between the near field and this image.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
References
Y. Leviatan: J. Appl. Phys.60 (1986) 1577.
J.F. Martin, C. Girard and A. Dereux: Phys. Rev. Lett.74 (1995) 526 (See Fig. lc and d).
W. Jhe and K. Jang: Ultramicroscopy61 (1995) 81.
M. Naya, S. Mononobe, R. Uma Maheswari, T. Saiki and M. Ohtsu: Opt. Commun.124 (1996) 9.
C. Girard and D. Courjon: Phys. Rev. B42 (1990) 9340.
K. Kobayashi and O. Watanuki: J. Vac. Sci. Technol. B14 (1996) 804.
A. Zvyagin and M. Ohtsu: Opt. Commun. (in press).
Author information
Authors and Affiliations
Additional information
This paper was originally presented at the first Asia-Pacific Workshop on Near Field Optics, which was held on August 17 and 18, 1996 at Seoul Education and Culture Center, Seoul, Korea, organized by the Condensed Matter Research Institute, Seoul National University.
Rights and permissions
About this article
Cite this article
Banno, I., Hori, H. & Inoue, T. An Ampere-like law for displacement vector field and near-field optical microscopy. Optical Review 3, 454–457 (1996). https://doi.org/10.1007/BF02932046
Received:
Accepted:
Issue Date:
DOI: https://doi.org/10.1007/BF02932046