Abstract
By using silicon wafer, penetrable to the infrared beam, the i.r. spectra of silica and solid samples were measured, and this method was proved to be advantageous than the conventional methods. The silicon wafer was thermally stable below 800‡C, and not significantly oxidized below the temperature. The silicon wafer technique for the gas adsorption studies had advantages on getting sharper absorptions of the brittle mineral samples and the efflorescent samples which were unable to be self-supported. Besides, this technique was effectively applicable to the samples such as cupric sulfate which easily react with KBr.
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Willard, H.H., Merrit, L.L., Dean, J.A. and Settle, F.A.: “Instrumental Method of Analysis”, D. Van Nostrand Company, New York, 205–206(1981).
Mattson, J.S., Lee, L., Mark jr. H.B., and Waber jr.W.J.,:J. Anal. Chem.,41, 355–358 (1969).
Mattson, J.S., Lee, L., Mark jr. H.B., and Waber jr. W.J.:J. Collo. Int. Sci.,33, 284–293 (1970).
Marcus, R.B. and Sheng, T.T.:J. Eleclrochem. Soc,129, 1278–1282(1982).
Benesi, H.A., and Jones, A.C.:J. Phys. Chem.,63, 179–182. (1958).
Spitzer, W.G., and Ligenza, J.R.:J. Phys. Chem. Solids.,17, 196–202 (1961).
Pliskin. W.A.:J. Thin Sol. Films.,2, 1–26 (1968).
Morrow, B.A. and Cody, I.A.:J. Phys. Chem.,80, 1995–1998(1976).
Boccuzzi, F., Coluccia, G., Morterra, C. and Zec-china, A.:J. Phys. Chem.,82, 1298–1303 (1978).
Shikha, A., Osipova, N.N. and Sokolova, T.A.:Miner. & Soil Micromorp.,37, 34–40 (1982).
Cachard, A., Roger, J.A., Pivot, J. and Dupay, C.H.S.:J. Phys. Slat. Sol.(a),5, 637–644 (1971).
Herzberg, G.: “Infrared and Raman Spectra of Polyatomic Molecules,” D. Van Nostrand Company, New York, 168–172(1966).
Little, L.H.: “Infrared Spectra of Adsorbed Species,” Academic Press, London, 66–84 (1966).
Peri, J.B.:J. Phys. Chem.,70, 3168–3179 (1966).
Imelik, B., Naccache, C, Taarit, Y.B., Vedrine, J.C., Coudurier, G. and Praliaud, H.: “Catalysis by Zeolites,” Elsevier Scientific Publishing Company, Amsterdam, 55–64 (1980).
Scherzer, J., Bass, J.L.:J. Phys. Chem.,79, 1200–1205(1975).
Blackwell, C.S.:J. Phys. Chem.,83, 3251–3257 (1979).
Blackwell, C.S.:J. Phys. Chem.,83, 3257–3261 (1979).
Nakamoto, K.: “Infrared and Raman Spectra of Inorganic and Coordination Compound,” A. WillyInterscience Pubcation, New York, 105–249 (1977).
Aika, K. and Lunsford, J.H.:J. Phys. Chem.,82, 1794–1800(1978).
Fukuda, Y. and Tanabe, K.:Bull. Chem. Soc. Jpn.,46, 1616(1973).
Eley, D.D., Keir, D.A. and Rudham, R.:J. Chem. Soc. Far. Trans. 1, 72, 1685–1693 (1976).
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Kim, JT., Kim, MC. Silicon wafer technique for infrared spectra of silica and solid samples (I). Korean J. Chem. Eng. 3, 45–51 (1986). https://doi.org/10.1007/BF02697522
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DOI: https://doi.org/10.1007/BF02697522