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J resistance curves in aluminum SEN specimens using Moiré interferometry

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Abstract

TheU y -displacement field obtained by white-light moiré interferometry were used to estimate the approximate far- and near-fieldJ-integral values associated with the subcritical crack growths in fatigue precracked 7075-T6 and blunt notched and fatigue precracked 2024-0 and 5052-H32 aluminum, single-edged notch (SEN) specimens. The initial phases of theJ-resistance curves for the somewhat brittle 7075-T6 and the two ductile 2024-0 and 5052-H32 aluminum SEN specimens are presented.

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Kang, B.S.J., Kobayashi, A.S. J resistance curves in aluminum SEN specimens using Moiré interferometry. Experimental Mechanics 28, 154–158 (1988). https://doi.org/10.1007/BF02317566

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  • DOI: https://doi.org/10.1007/BF02317566

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