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Identification of trace impurities in pure and doped YAlO3 and Y3Al5O12 crystals by their fluorescence and by the EMA method

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Abstract

Trace uncontrolled impurities as Ce3+, Cr3+, Eu3+ and Nd3+ were detected in YAlO3 and YAlO3: Cr crystals from their fluorescence by high sensitive photon counting detection. The concentrations of Ce, Cr, Eu, Nd and some other impurities (Tm, Ho, Mn, Mg, Fe) were also determined by electron beam excited X-ray microanalysis (abbr. EMA) in YAlO3 and Y3Al5O12 crystals (pure or doped). Both the methods (fluorescence detection and EMA) are compared, fluorescence properties of some trace impurities were determined and their influence on local distribution and transfer processes (Ce3+→Nd3+, Cr3+→ Nd3+) in these crystals are discussed.

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Authors and Affiliations

  1. Institute of Physics, Czech Acad. Sci., Cukrovarnická 10, 16200, Praha 6, Czech Republic

    J. A. Mareš, J. Chval & M. Nikl

  2. Laboratoire de Physico-chimie des Matériaux Luminescents, Université Lyon I, URA 4422 CNRS, 43, Bd du 11 Novembre 1918, 69622, Villeurbanne, France

    G. Boulon

Authors
  1. J. A. Mareš
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  2. J. Chval
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  3. M. Nikl
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  4. G. Boulon
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Additional information

The authors are grateful to J. Kvapil, Jos. Kvapil and K. Blažek from Preciosa a.s., Division Monokrystaly, Turnov, Czech Republic, for supplying us with YAlO3 and Y3Al5O12 single crystals.

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Mareš, J.A., Chval, J., Nikl, M. et al. Identification of trace impurities in pure and doped YAlO3 and Y3Al5O12 crystals by their fluorescence and by the EMA method. Czech J Phys 43, 683–696 (1993). https://doi.org/10.1007/BF01591542

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  • DOI: https://doi.org/10.1007/BF01591542

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