Abstract
A nanosecond-time-resolution pyrometer has been developed for measuring the transient surface temperature of a solid material heated by pulsed excimer-laser irradiation. Fast germanium diodes are employed to capture the transient thermal emission signals in the wavelength range between 1.2 and 1.6 pm. The surface temperature is derived from the measured spectral thermal emission. The directional spectral emissivity is determined in situ by measuring the transient directional spectral reflectivity and applying Kirchhoffs law. The experimental results are in good agreement with numerical thermal modeling predictions. The pyrometric thermal emission measurement also yields the solid/liquid interface temperature during the pulsed excimer-laser-induced melting. The relation between the measured interface superheating temperature and the interface velocity reveals the melting kinetic relation during the high-power, short-pulse laser-induced phase-change processes.
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Abbreviations
- C 1, blackbody radiation constant:
-
C 1 = 3.7420 × 108 W μm4/m2
- C 2, blackbody radiation constant:
-
C 2 = 1.4388 × 104 μm K
- C p :
-
specific heat in J/kg K
- dA :
-
area on the laser-heated spot whose thermal emission is detected in mm2
- D :
-
Detector responsivity in A/W
- e λb :
-
blackbody spectral emissive power in W/m2 μm
- f :
-
focal length of lens in mm
- F :
-
laser fluence in J/cm2
- i:
-
complex imaginary unit (i = √−1)
- K :
-
thermal conductivity in W/m K
- L :
-
latent heat in J/kg
- M :
-
minimization function to calculate the temperature from thermal emission in (6) and (10)
- ñ :
-
complex refractive index
- R s :
-
reflectivity
- R s :
-
specular reflectivity
- R d :
-
diffuse reflectivity
- T :
-
temperature in K
- T eff :
-
effective temperature (7) in K
- T int :
-
interface temperature in K
- T m :
-
equilibrium melting temperature in K
- V :
-
voltage recorded on the oscilloscope in V
- V int :
-
velocity of the solid/liquid interface in m/s
- W :
-
impedance of the oscilloscope in Ω
- Superscript: i :
-
directional
- Subscripts: c :
-
calculated results
- exe:
-
excimer laser
- ℓ:
-
liquid silicon
- m:
-
measured results
- qz:
-
quartz substrate
- s:
-
solid silicon
- λ :
-
spectral quantity
- α :
-
absorptivity
- ΔT :
-
interfacial superheating temperatureΔT =T t −T m in K
- ɛ :
-
emissivity
- θ :
-
polar angle
- Θ :
-
angle of light incidence
- λ :
-
wavelength in μm
- ϱ :
-
density in kg/m3
- τ :
-
transmissivity of optics
- φ :
-
Azimuthal angle
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Xu, X., Grigoropoulos, C.P. & Russo, R.E. Nanosecond-time-resolution thermal emission measurement during pulsed excimer-laser interaction with materials. Appl. Phys. A 62, 51–59 (1996). https://doi.org/10.1007/BF01568087
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DOI: https://doi.org/10.1007/BF01568087