Abstract
A new type of X-ray interferometer is described in which total reflection is established in the process of beam splitting, beam deflection and beam recombination by making essential use of simultaneous Bragg case diffraction from two different sets of net planes.
The amplitudes of the interfering beams are calculated along the lines of the dynamical theory of X-ray diffraction. It is found that in the general non-planar three-beam case a complicated interaction of polarization states occurs which results in a destruction of interference contrast. On the other hand, in the planar case the polarization states stay separated and interference contrast can reach 100%.
A monolithic interferometer using coplanar (440) and (404) reflections was made from a perfect silicon crystal and operated successfully. The degree of interference contrast was investigated experimentally with NiK α radiation of an ordinary X-ray tube and with synchrotron X-rays from DESY.
Focusing requirements and source properties influencing the coherence conditions are discussed.
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Part of doctorate thesis (University of Dortmund, 1976)
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Graeff, W., Bonse, U. A three-beam case X-ray interferometer. Z Physik B 27, 19–32 (1977). https://doi.org/10.1007/BF01315501
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DOI: https://doi.org/10.1007/BF01315501