Abstract
Amorphous SnOx films were deposited by ion-beam sputtering on sintered alumina substrates. Amorphous film sensors were prepared by annealing the films at 300° C for 2 h in air. The thickness dependence of resistivity and hydrogen gas sensitivity were measured at 150° C over the thickness range ∼ 1 to 700 nm. A resistivity maximum was observed in ultrathin films. Resistivity increased by three orders of magnitude with increasing film thickness from 0.9 to 7.4 nm and then decreased by five orders of magnitude from 7.4 to 35 nm. Ultrathin film sensors showed sensitivity maxima around a thickness of 10 nm. Sensitivity and resistivity of ultrathin films were significantly influenced by the thermal expansion coefficient and the surface state of the substrate.
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Suzuki, T., Yamazaki, T., Yoshioka, H. et al. Thickness dependence of H2 gas sensor in amorphous SnQx films prepared by ion-beam sputtering. J Mater Sci 23, 145–149 (1988). https://doi.org/10.1007/BF01174046
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DOI: https://doi.org/10.1007/BF01174046