Abstract
The problem of testing and diagnosing dedicated architectures directly derived from an algorithmic flow is here considered. The main scope is that of defining a procedure allowing complete fault coverage (within a specified fault model) and-possibly-non-ambiguous fault location for such architectures. Information required is limited to the structure of the algorithmic flow and to a functional description of the architecture's building blocks; no further control and observation points are inserted and no detailed knowledge of the internal structure of the building blocks is required. In correspondence, functional error models are defined. The case study examined here is that of radix-2FFT graphs. It will be proved that a one-pass testing procedure allows detection of all single faults and location-without ambiguity-to the corresponding equivalence class. It will also be proved that the procedure requiresO(N) operations for anN-point array. In the case of multiple faults, fault coverage is still granted but non-ambiguous fault location is in general not possible.
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Antola, A., Sami, M.G. & Sciuto, D. Testing and diagnosis ofFFT arrays. J VLSI Sign Process Syst Sign Image Video Technol 3, 225–236 (1991). https://doi.org/10.1007/BF00925833
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DOI: https://doi.org/10.1007/BF00925833