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Röntgenspektroskopischer Nachweis von amorphem Siliciumoxid in röntgenographisch reinen E-Phasen

Detection of amorphous silicon oxides in guinier-pure E-phases by X-ray spectroscopy

  • Anorganische, Struktur- und Physikalische Chemie
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Monatshefte für Chemie / Chemical Monthly Aims and scope Submit manuscript

Abstract

The E-phases TiNiSi and TiCoSi have been produced using the Auxiliary Metal Bath Procedure. By dissolving the bath component copper undesired silicon oxides have been formed which, due to their amorphous state, could not be detected byGuinier analysis. Because of the typical structural features of the SiL 2.3-emission band of silicon oxygen compounds, the oxide has been detected, and its amount in the silicon spectra of the E-phases has been estimated. After a special cleaning procedure of the specimens the SiL 2.3-bands could be measured.

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Author notes

  1. E. Hieke

    Present address: Forschungslaboratorien der Siemens AG, D-8000, München, Bundesrepublik Deutschland

Authors and Affiliations

  1. Sektion Physik der Universität München, Geschwister-Scholl-Platz, D-8000, München, Bundesrepublik Deutschland

    G. Wiech & Chr Beyreuther

  2. Forschungslaboratorium für Festkörperchemie der Universität, Geschwister-School-Platz, D-8000, München, Bundesrepublik Deutschland

    E. Hieke

Authors
  1. G. Wiech
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  2. Chr Beyreuther
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  3. E. Hieke
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Wiech, G., Beyreuther, C. & Hieke, E. Röntgenspektroskopischer Nachweis von amorphem Siliciumoxid in röntgenographisch reinen E-Phasen. Monatshefte für Chemie 105, 302–307 (1974). https://doi.org/10.1007/BF00907376

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  • DOI: https://doi.org/10.1007/BF00907376

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