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Imaging of tile grain boundaries in thin silver films by scanning reflection electron microscopy

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Journal of Materials Science Letters

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Authors and Affiliations

  1. Instituto de Física, U.N.A.M., Apartado Postal 20-364, 01000, Mexico, D.F., Mexico

    Victor M. Castaño & Roberto Hernández

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  1. Victor M. Castaño
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  2. Roberto Hernández
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Castaño, V.M., Hernández, R. Imaging of tile grain boundaries in thin silver films by scanning reflection electron microscopy. J Mater Sci Lett 8, 21–23 (1989). https://doi.org/10.1007/BF00720240

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  • DOI: https://doi.org/10.1007/BF00720240

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