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Contact versus bulk noise in resistive layers

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Abstract

General formulae are derived to calculate the noise generated by a resistor of arbitrary shape. Contact and bulk noise have been taken into account. By calculating a particular example it will be shown that the influence of the contact and bulk noise can be changed by varying the resistor's shape.

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References

  1. W. Van Bokhoven: Arch. Elektr. Übertragungstech.32, 349–352 (1978)

    Google Scholar 

  2. L. Vandamme, W. Van Bokhoven: Appl. Phys.14, 205–215 (1977)

    Google Scholar 

  3. S. Demolder, A. Van Calster, M. Vandendriessche: Current noise in thick and thin film resistors. Proc. 3rd Europ. Hybrid Microelectronics Conference, Avignon (1981) pp. 19–25

  4. G. De Mey; Appl. Phys.6, 189–197 (1975)

    Google Scholar 

  5. E.N. Economon:Green's Functions in Quantum Physics, 2nd edn., Springer Ser. Solid-State Sci.7 (Springer, Berlin, Heidelberg 1983)

    Google Scholar 

  6. J. Shyn, G. Temes, K. Yao: IEEEJ. SC-17, 1070–1076 (1982)

    Google Scholar 

  7. A. Angot:Compléments de mathématiques (Masson, Paris 1972) pp. 145–146

    Google Scholar 

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De Mey, G. Contact versus bulk noise in resistive layers. Appl. Phys. A 36, 183–187 (1985). https://doi.org/10.1007/BF00616550

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  • DOI: https://doi.org/10.1007/BF00616550

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