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Nanometer-microscopy of the electron transmission through an ultrathin (3–22 nm) Au film and of the Au-Si schottky barrier height

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Abstract

Direct imaging with nanometer scale resolution of the Schottky barrier height and of the ballistic transmission of electrons through an ultrathin metal film is demonstrated for the first time. The images are obtained by applying a new pixel-by-pixel evaluation method to the ballistic electron emission spectroscopy (BEES). We find a laterally uniform Schottky barrier height φB=0.88 eV for ultrathin (3–22 nm) Au films evaporated on Si. The transmission coefficient is strongly correlated with the island structure of the Au film. A transmission decay length λ=14 nm is determined by a statistical analysis of the transmission coefficient with variation of the film thickness.

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  1. Institut für Angewandte Physik, Universität Erlangen-Nürnberg, Staudtstrasse 7, W-8520, Erlangen, Fed. Rep. Germany

    H. Palm, M. Arbes & M. Schulz

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  1. H. Palm
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  2. M. Arbes
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  3. M. Schulz
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Palm, H., Arbes, M. & Schulz, M. Nanometer-microscopy of the electron transmission through an ultrathin (3–22 nm) Au film and of the Au-Si schottky barrier height. Appl. Phys. A 56, 1–7 (1993). https://doi.org/10.1007/BF00351895

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