Abstract
Recently there has been renewed interest in fault detection in static CMOS circuits through I DDQ monitoring. This work shows that, in addition to fault detection, accurate fault diagnosis may be performed using a combination of current and voltage observations. The proposed system combines a simple single fault model for test generation with a more realistic multiple defect model for diagnosis, and as a result requires only minor modifications to existing stuck-at fault ATPG software. The associated hardware is sufficiently simple that on-board implementation is possible. Experimental results demonstrate the effectiveness of the method on a standard-cell ASIC.
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Aitken, R.C. Diagnosis of leakage faults with I DDQ . J Electron Test 3, 367–375 (1992). https://doi.org/10.1007/BF00135340
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DOI: https://doi.org/10.1007/BF00135340