Abstract
Nuclear forensic analysis is a relatively new approach to provide technical support for the investigation of security incidents that may arise due to unauthorized use of nuclear or radioactive materials. The increasing rate of smuggling, trafficking, illegal possession, and theft of nuclear or radioactive material has become a worldwide challenge. Considering the potential hazards associated with the nuclear/radioactive material, the proper investigation and identification of the material are extremely important to prevent illegal trafficking and other unauthorized activities. The nuclear forensic analysis provides clues on the origin and intended use of nuclear materials which supports nuclear attribution. In a designated nuclear forensic laboratory, seized nuclear/radioactive material will be analyzed for the characteristic signatures using several established analytical techniques. To establish the origin and nature of samples, it is important to investigate elemental composition, isotopic composition, chemical impurities, macroscopic appearance, microstructure, etc. Comparison of the signatures using the nuclear forensic library consisting of a database of known samples, processes, etc. also is an important requirement. The analyses should be carried out following certified procedures and standard techniques. Intercomparison exercises and certified reference materials play an important role in the quality assurance of data.
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Annexure A
Annexure A
A list abbreviations and acronyms used in the chapter (arranged alphabetically)
- μ-Raman:
-
Micro Raman Spectroscopy
- μ-XRF:
-
Micro X-ray Fluorescence
- AMS:
-
Accelerated Mass Spectrometry
- AS:
-
Alpha Spectrometry
- ASCLD:
-
The American Society of Crime Laboratory Directors
- ASTM:
-
American Society for Testing and Materials
- AWCC:
-
Active Well Coincidence Counters
- CRM:
-
Certified Reference Material
- DDA:
-
Differential Die-Away Technique
- FTIR:
-
Fourier Transform Infrared Spectrometry
- FT-TIMS:
-
Fission Track Thermal Ionization Mass Spectrometry
- GC-MS:
-
Gas Chromatograph-Mass Spectrometer
- HEU:
-
Highly Enriched Uranium
- HPGe:
-
High Purity Germanium (HPGe) Detector
- HRGS:
-
High Resolution Gamma Spectrometer
- IAEA:
-
International Atomic Energy Agency
- IC:
-
Ion Chromatograph
- ICPMS:
-
Inductively Coupled Plasma Mass Spectrometry
- ICP-OES:
-
Inductive Coupled Plasma Optical Emission Spectrometry
- ICP-SFMS:
-
Inductively Coupled Plasma Sector Field Mass Spectrometer
- IDMS:
-
Isotope Dilution Mass Spectrometer
- IRMM:
-
Institute For Reference Materials and Measurements
- IRMS:
-
Isotope Resolution Mass Spectrometry
- ISO:
-
International Standards Organization
- ITDB:
-
Incident and Trafficking Database
- ITWG:
-
International Technical Working Group (Nuclear Forensics)
- Kev:
-
Kilo Electron Volt (A unit of energy)
- LA:
-
Laser Ablation
- LEU:
-
Low Enriched Uranium
- LSC:
-
Liquid Scintillation Counting
- MC-ICPMS:
-
Multi Collector Inductively Coupled Plasma Mass Spectrometry
- MC-ICPMS:
-
Multi-Collector Inductively Coupled Plasma Sector Field Mass Spectrometer
- MeV:
-
Mega Electron Volt (A unit of energy)
- Ms:
-
Mass Spectrometer
- NAA:
-
Neutron Activation Analysis
- NBS:
-
National Bureau of Standards, USA
- NDA:
-
Non-Destructive Assay
- NF:
-
Nuclear Forensics
- NIST:
-
National Institute of Science and Technology, USA
- NRF:
-
Nuclear Resonance Fluorescence
- PIPS:
-
Passivated Implanted Planar Silicon Detector
- QA:
-
Quality Assurance
- QC:
-
Quality Control
- R&D:
-
Research and Development
- RDD:
-
Radiological Dispersion Device
- REE:
-
Rare Earth Element
- RIMS:
-
Resonance Ionization Mass Spectrometry
- SEM-EDS:
-
Scanning Electron Microscope with Energy Dispersive Sensor
- SIMS:
-
Secondary Ionization Mass Spectrometry
- SNM:
-
Special Nuclear Material
- SPC:
-
Statistical Process Control
- SRM:
-
Standard Reference Material
- TEM:
-
Transmission Electron Microscopy
- TIMS:
-
Thermal Ionization Mass Spectrometry
- UOC:
-
Uranium Ore Concentrate
- XAS:
-
X-Ray Absorption Spectroscopy
- XRD:
-
X-Ray Diffraction
- XRF:
-
X-Ray Fluorescence
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Mishra, S., Anilkumar, S., Vinod Kumar, A. (2023). Nuclear Forensics: Role of Radiation Metrology. In: Aswal, D.K., Yadav, S., Takatsuji, T., Rachakonda, P., Kumar, H. (eds) Handbook of Metrology and Applications. Springer, Singapore. https://doi.org/10.1007/978-981-99-2074-7_134
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