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Systematic Verification of BGA Solder Joint Reliability in Multiple Ways

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Proceedings of the Seventh Asia International Symposium on Mechatronics

Part of the book series: Lecture Notes in Electrical Engineering ((LNEE,volume 589))

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Abstract

Based on the daily work summary and the induction of actual case processing methods, a systematic and hierarchical process verification scheme of BGA solder joints is proposed in the paper. Then the verification scheme is introduced through an actual case. Based on the application examples, the scheme is confirmed to ensure the adequacy of the experimental dates, and the rigorous and accuracy of the conclusion.

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References

  1. He, Z., Liang, K., Zhou, Q., Gong, G., Wang, X.: BGA soldering quality detection techniques by X ray imaging. Electron. Process Technol. 37(1), 32–39 (2016)

    Google Scholar 

  2. Chen, W.U., Wei-yuan, C.H.E.N.: Failure analysis of BGA solder joints based on dye penetrate testing. Mod. Manuf. Eng. 10, 111–114 (2016)

    Google Scholar 

  3. Liang, D., Liu, J., Zhou, J.: Improve the reliability of BGA solder joint. Electron. Process Technol. 29(3), 146–148 (2008)

    Google Scholar 

  4. Wang, Y., Mo, Y., He, W., Lin, J., Xu, Y., Wan, Y.: Failure analysis on BGA solder joints. Printed Circ. Inf. 2008(7), 61–64 (2008)

    Google Scholar 

  5. Li, L., Feng, R., Zhao, S.: Research on mixed joints reliability of lead-free BGA and Sn-Pb solder-paste. Electron. Process Technol. 39(2), 88–91 (2018)

    MathSciNet  Google Scholar 

  6. Interrante, M., Coffin, J., Cole, M.: Lead-free package interconnections for ceramic grid arrays. In: IEEE/CPMT/SEMI 28th Electronics Manufacturing Technology Symposium (2003)

    Google Scholar 

  7. Xie, D.J.: A new experimental method to evaluate creep fatigue life of flip-chip solder joints with underfill. Microelectron. Reliab. 40(7), 1191–1198 (2000)

    Article  Google Scholar 

  8. Lu, L.N., Huang, H.Z., Wu, B.Y., Zhou, Q., Su, X.X., Cai, M.: Investigation of thin small outline package (TSOP) solder joint crack after accelerated thermal cycling testing. In: International Conference on Electronic Packaging Technology & High Density Packaging, pp. 923–926. IEEE (2009)

    Google Scholar 

  9. Lall, P., Deshpande, S., Wei, J., Suhling, J.: Non-destructive crack and defect detection in SAC solder interconnects using cross-sectioning and X-ray micro-CT. In: 2014 IEEE 64th Electronic Components and Technology Conference (ECTC), pp. 1449–1456. IEEE (2014)

    Google Scholar 

  10. Mortensen, A.W., Lee, M.C., Devaney, RM.: Characterization and failure analysis techniques for ball grid array solder joints. In: China High-Level SMT Technology Conference (2016)

    Google Scholar 

  11. Chiu, C.C., Li, Y.T., Li, H.F., Wang, C.T.: Fine pitch BGA solder joint split in SMT process. In: 4th International Microsystems, Packaging, Assembly and Circuits Technology Conference, IMPACT 2009. IEEE (2009)

    Google Scholar 

  12. Ding, R.R., Yang, Y.B., Cheng, B., Zhu, Y., Gao, N.Y.: Research on reliability of ball/column re-attachment of CBGA/CCGA ICs. Electron. Packing 12, 9–13 (2012)

    Google Scholar 

  13. Mattila, T.T., Vuorinen, V., Kivilahti, J.K.: Impact of printed wiring board coatings on the reliability of lead-free chip-scale package interconnections. Mater. Res. Soc. 19, 3214–3223 (2004)

    Article  Google Scholar 

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Correspondence to Wei Lu .

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Lu, W., Jin, D., Wan, Y. (2020). Systematic Verification of BGA Solder Joint Reliability in Multiple Ways. In: Duan , B., Umeda, K., Hwang, W. (eds) Proceedings of the Seventh Asia International Symposium on Mechatronics. Lecture Notes in Electrical Engineering, vol 589. Springer, Singapore. https://doi.org/10.1007/978-981-32-9441-7_97

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