Abstract
In this chapter, we present an industrial nondestructive technique to can identify and localize geometrical microscopic defects in a silver microstrip line. We worked on two types of defects: the narrow transverse slits and the overflows. It is true that there are several techniques to detect defects on the microstrip line, but these techniques can be destructive and do not allow us to localize and characterize the defect like the measure of the impedance or to identify the defect when the type of defect is unknown like the reflectometry. The proposed technique is based on the measure of the scatting parameters, the calculation of the characteristic impedance of each model of the microstrip line (undamaged and defective), and the comparison between the different results obtained from the practical and the theoretical tests.
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References
Alok Kumar, R., Munira, B., & Shanu, S. (2014). Design and simulation model for compensated and optimized t-junctions in microstrip line. International Journal of Advanced Research in Computer Engineering and Technology, 3, 4216–4220.
Auzanneau, F., Ravot, N., & Incarbone, L. (2016). Off-line fault localization technique on HVDC submarine cable via time-frequency domain reflectometry. IEEE Sensors Journal, 16, 8027–8034.
Bagad, V. S. (2008). Microwaves and radar. India: Technical Publications Pune.
Chandra, P., Dobkin, D., Bensky, D., Olexa, R., Lide, D., & Dowla, F. (2008). Wireless networking: Know it all. Amsterdam: Elsevier.
Chaturvedi, S., Bozanic, M., & Sinha, S. (2016). Transmission line parameters and effect of conductive substrates on their characteristics. IRomanian Journal Of Information Science And Technology, 19, 199–212.
Deen, M. J., & Fjeldly, T. A. (2002). CMOS RF modeling characterization and applications. USA: World Scientific.
Edwards, T. C., & Steer, M. B. (2016). Foundations for microstrip circuit design. United Kingdom: Wiley.
Farhat, R., Marcos, R., & Mario, P. (2016). Electromagnetic time reversal: Application to EMC and power systems. UK: Wiley.
Giovanni Ghione, M. P. (2018). Microwave electronics. UK: Cambridge University Press.
Gustrau, F. (2012). RF and microwave engineering: Fundamentals of wireless communications. UK: Wiley.
Hickman, I. (2007). Practical RF handbook. UK: Elsevier.
Hoefer, W. J. R. (1977). Equivalent series inductivity of a narrow transverse slit in microstrip. MTT Transactions, 25, 822–824.
Huang, Y., & Boyle, K. (2008). Antennas: from theory to practice. UK: Wiley.
Keqian Zhang, D. L. (2008). Electromagnetic theory for microwaves and optoelectronic. Germany: Springer.
Kwon, G.-Y., Lee, C.-K., Lee, G. S., Lee, Y. H., Chang, S. J., Jung, C.-K., et al. (2017). Chaos time domain reflectometry for online defect detection in noisy wired networks. IEEE Transactions on Power Delivery, 32(3), 1626–1635.
Natarajan, D. (2013). A practical design of lumped, semi-lumped and microwave cavity filters. Germany: Springer.
Raju, G. (2009). Electromagnetic field theory and transmission lines. India: Dorling Kindersley.
Robertson, I., Chongcheawchamnan, M., & Somjit, N. (2016). Microwave and millimeter-wave design for wireless communications. UK: Wiley.
Shoaib, N. (2017). Vector network analyzer (VNA) measurements and uncertainty assessment. Switzerland: Springer.
Terry, E., & Michael, S. (2016). Foundations for microstrip circuit design. UK: Wiley.
Tze Mei, K., Mohd, A., Ariffin, S. S., & Madelina, B. S. M. (2017). Improvement in cable defects assessment using time domain reflectometry technique. Indian Journal of Science and Technology, 10, 1–7.
Wen, C. (1969). Coplanar waveguide: A surface strip transmission line suitable for nonreciprocal gyromagnetic device applications. IEEE Transactions on Microwave Theory and Techniques, 17, 1087–1090.
Wolff, I., Kompa, G., & Mehran, R. (1972). Calculation method for microstrip discontinuities and t-junctions. Electronics Letters, 8, 177–179.
Acknowledgements
This work is a part of a project proposed by the company APEM-SACELEC. A special thanks to Sys’Com, laboratory of ENIT, and ENSTA for their collaboration.
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Troudi, L., Jelassi, K., Sellaouti, M. (2020). A Nondestructive Technique to Identify and Localize Microscopic Defects on a Microstrip Line. In: Derbel, N., Ghommam, J., Zhu, Q. (eds) Diagnosis, Fault Detection & Tolerant Control. Studies in Systems, Decision and Control, vol 269. Springer, Singapore. https://doi.org/10.1007/978-981-15-1746-4_1
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DOI: https://doi.org/10.1007/978-981-15-1746-4_1
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