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An Improved Feature Selection Algorithm for Fault Level Identification

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Recent Trends in Intelligent Computing, Communication and Devices

Part of the book series: Advances in Intelligent Systems and Computing ((AISC,volume 1006))

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Abstract

In fault level identification, there are ordinal structures between different levels, and some features have the monotonic dependency with decision. In this paper, we propose a feature selection algorithm for fault level identification based on ordinal classification. First, we design a new feature evaluation function to evaluate the quality of features based on ordinal rough set. Second, combining with the search strategy of genetic algorithm (GA), an improved feature selection algorithm is proposed. Finally, the proposed feature selection algorithm is employed to crack level identification. Experimental results show that the proposed algorithm not only can reduce the feature dimension but also improve the accuracy of identification.

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Acknowledgements

This work is supported by Youth Project of Fujian Province of China (Grant No. JAT160350).

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Correspondence to Weiwei Pan .

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Pan, W. (2020). An Improved Feature Selection Algorithm for Fault Level Identification. In: Jain, V., Patnaik, S., Popențiu Vlădicescu, F., Sethi, I. (eds) Recent Trends in Intelligent Computing, Communication and Devices. Advances in Intelligent Systems and Computing, vol 1006. Springer, Singapore. https://doi.org/10.1007/978-981-13-9406-5_12

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