Skip to main content

Scanning Transmission X-Ray Microscopy

  • Chapter
  • First Online:
Compendium of Surface and Interface Analysis

Abstract

Scanning transmission X-ray microscopy (STXM) is a method to obtain a microscopic image of the raster-scanned sample by detecting the transmission intensity of the focused X-rays. As drawn in Fig. 96.1, a Fresnel zone plate (FZP) is often used to focus the soft X-rays from the synchrotron radiation sources (Attwood in Soft X-rays and Extreme Ultraviolet Radiation: Principles and Applications. Cambridge University Press, 1999 [1]). An order-sorting aperture (OSA) is used to omit the zeroth and higher order diffractions. The photon energy can be tuned around the absorption edge of a specific element. The spatial resolution, i.e. the focusing size of the X-rays in the soft X-ray STXM is typically 20–100 nm. It is in principle determined by the diffraction limit of the lithographically fabricated FZPs (Attwood in Soft X-rays and Extreme Ultraviolet Radiation: Principles and Applications. Cambridge University Press, 1999 [1]). The most important measurement mode in the STXM is an “image stack,” that is, a number of images at different photon energy points to obtain a dataset with space (XY) plus energy (E) dimensions. From the dataset, one can obtain a local spectrum to analyze the near-edge X-ray absorption fine structure (NEXAFS).

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Institutional subscriptions

References

  1. Attwood, D.: Soft X-rays and Extreme Ultraviolet Radiation: Principles and Applications, Chap. 9. Cambridge University Press (1999)

    Google Scholar 

  2. Hitchcock, A.P.: Soft X-ray spectromicroscopy and ptychography. J. Elec. Spectrosc. Relat. Phenom. 200, 49–63 (2015)

    Article  CAS  Google Scholar 

  3. Kilcoyne, A.L.D., Tyliszczak, T., Steele, W.F., Fakra, S., Hitchcock, P., Franck, K., Anderson, E., Harteneck, B., Rightor, E.G., Mitchell, G.E., Hitchcock, A.P., Yang, L., Warwick, T., Ade, H.: Interferometer-controlled scanning transmission X-ray microscopes at the Advanced Light Source. J. Synchrotron Rad. 10, 125–136 (2003)

    Article  CAS  Google Scholar 

  4. Takeichi, Y., Inami, N., Suga, H., Miyamoto, C., Ueno, T., Mase, K., Takahashi, Y., Ono, K.: Design and performance of a compact scanning transmission X-ray microscope at the Photon Factory. Rev. Sci. Instrum. 87, 013704 (2016)

    Article  CAS  Google Scholar 

  5. Koprinarov, I., Hitchcock, A.P., Li, W.H., Heng, Y.M., Stöver, H.D.H.: Quantitative Compositional Mapping of Core-Shell PolymerMicrospheres by Soft X-ray Spectromicroscopy. Macromol. 34, 4424–4429 (2001)

    Article  CAS  Google Scholar 

  6. Lerotic, M., Mak, R., Wirick, S., Meirer, F., Jacobsen, C.: MANTiS: a program for the analysis of X-ray spectromicroscopy data. J. Synchrotron Rad. 21, 1206–1212 (2014)

    Article  CAS  Google Scholar 

  7. Hitchcock, A.P., Morin, C., Zhang, X., Araki, T., Dynes, J., Stöver, H., Brash, J., Lawrence, J.R., Leppard, G.G.: Soft X-ray spectromicroscopy of biological and synthetic polymer systems. J. Elec. Spectrosc. Relat. Phenom. 144, 259–269 (2005)

    Article  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Yasuo Takeichi .

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2018 Springer Nature Singapore Pte Ltd.

About this chapter

Check for updates. Verify currency and authenticity via CrossMark

Cite this chapter

Takeichi, Y. (2018). Scanning Transmission X-Ray Microscopy. In: The Surface Science Society of Japan (eds) Compendium of Surface and Interface Analysis. Springer, Singapore. https://doi.org/10.1007/978-981-10-6156-1_96

Download citation

Publish with us

Policies and ethics