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Design of Jitter Spectral Shaping as Robust with Various Oversampling Techniques in OFDM

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Smart Computing and Informatics

Part of the book series: Smart Innovation, Systems and Technologies ((SIST,volume 77))

Abstract

Deformation caused by the jitter acts as a limiting factor for the performance of the OFDM system in high data rate. The letter says that oversampling is used to reduce jitter noise. Two types of techniques fractional oversampling and integral oversampling are considered. The simulation results are compared with the theoretical results of phase jitter analysis showing very precise obligations. Oversampling results in 3 dB reduction of jitter noise for every doubling of the sampling frequency.

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Authors and Affiliations

  1. Department of Computer Science Engineering, MLR Institute of Technology, Hyderabad, India

    Syed Umar & N. Priya

  2. Department of Information Technology, Gokaraju Rangaraju Institute of Engineering and Technology, Hyderabad, India

    P. Gayathri

  3. Department of Computer Science Engineering, Narsaraopet Engineering College, Guntur, India

    T. Subba Reddy

  4. Department of Electronics and Communication Engineering, K L University, Vaddeswaram, India

    Azeem Mohammed Abdul

Authors
  1. Syed Umar
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  2. N. Priya
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  3. P. Gayathri
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  4. T. Subba Reddy
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  5. Azeem Mohammed Abdul
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Corresponding author

Correspondence to Syed Umar .

Editor information

Editors and Affiliations

  1. Department of Computer Science and Engineering, PVP Siddhartha Institute of Technology, Vijayawada, Andhra Pradesh, India

    Suresh Chandra Satapathy

  2. Department of Electronics and Communication Engineering, Shri Ramswaroop Memorial Group of Professional Colleges, Lucknow, Uttar Pradesh, India

    Vikrant Bhateja

  3. Electronics and Communication Sciences Unit, Indian Statistical Institute, Kolkata, West Bengal, India

    Swagatam Das

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Umar, S., Priya, N., Gayathri, P., Subba Reddy, T., Abdul, A.M. (2018). Design of Jitter Spectral Shaping as Robust with Various Oversampling Techniques in OFDM. In: Satapathy, S., Bhateja, V., Das, S. (eds) Smart Computing and Informatics . Smart Innovation, Systems and Technologies, vol 77. Springer, Singapore. https://doi.org/10.1007/978-981-10-5544-7_63

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  • DOI: https://doi.org/10.1007/978-981-10-5544-7_63

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  • Publisher Name: Springer, Singapore

  • Print ISBN: 978-981-10-5543-0

  • Online ISBN: 978-981-10-5544-7

  • eBook Packages: EngineeringEngineering (R0)

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