Abstract
PMMA-surfaces have been investigated by scanning force microscopy as a function of temperature and imaging conditions. A stand-alone type scanning force microscope was employed together with a heating stage to investigate a model polymer substance, PMMA, as a function of temperature. Contact mode imaging induced wavy structures at higher temperatures, whereas intermittent imaging in the pulsed force mode showed negligible interactions.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
Similar content being viewed by others
References
G. Binnig, C. F. Quate, and C. Gerber, “Atomic Force microscope,” Phys. Rev. Lett. 56(9), 930–933 (1986).
G. Meyer and N. M. Amer, “Novel optical approach to atomic force microscopy,” Appl. Phys. Lett. 53(12), 1045–1047 (1988).
S. Alexander, L. Hellemans, O. Marti, J. Schneir, V. Elings, P. K. Hansma, M. Longmire, and J. Gurley, “An atomic-resolution atomic-force microscope implemented using an optical lever,” J. Appl. Phys. 65, 164 (1989).
O. Marti, J. Colchero, and J. Mlynek, “Combined Scanning Force and Friction Microscopy of Mica,” Nanotechnology 1, 141–144 (1990).
G. Meyer and N. M. Amer, “Simultaneous measurement of lateral and normal forces with an optical-beam-deflection AFM,” Appl. Phys. Lett. 57(20), 2089–2091 (1990).
G. Binnig, C. Gerber, E. Stoll, T. R. Albrecht, and C. F. Quate, “Atomic Resolution with Atomic Force Microscope,” Europhys. Lett. 3(12), 1281–1286 (1987).
O. Marti, B. Drake, and P. K. Hansma, “Atomic force microscopy of liquid-covered surfaces: Atomic resolution images,” Appl. Phys. Lett. 51(7), 484–486 (1987).
O. Marti, “Instrumentation for Scanning Force Microscopy and Friction Force Microscopy,” in this book.
N. Burnham, “A beginners guide to scanning probe microscopy,” in this book.
G. Strobl, The Physics of polymers( Springer Verlag, Heidelberg, 1996 ).
E. J. Donth, Relaxation and Thermodynamics in Polymeres: Glass Transition( Akademie Verlag, Berlin, 1992 ).
M. Hipp, H. Bielefeldt, J. Colchero, O. Marti, and J. Mlynek, “A Stand-Alone Scanning Force and Friction Microscope,” Ultramicroscopy 42–44, 1498–1503 (1992).
M. Binggeli, R. Christoph, H. E. Hintermann, and O. Marti, “Atomic Scale Tribometer for Friction Studies in Controlled Atmosphere,” Surface and Coatings Technology 62, 523–528 (1993).
M. Radmacher, M. Fritz, and P. K. Hansma, “Imaging soft samples with the atomic force microscope: Gelatin in water and propanol,” Biophys.J. 69, 264–270 (1995).
G. Haugstad, W. L. Gladfelter, E. B. Weberg, R. T. Weberg, and R. R. Jones, “Probing molecular relaxation on polymer surfaces with friction force microscopy,” Langmuir 11(9), 3473–3482 (1995).
J. Radler, M. Radmacher, and H. E. Gaub, “Velocity-dependent forces in atomic force microscopy imaging of lipid films,” Langmuir 10, 3111–3115 (1994).
L. Nick, A. Kindermann, and J. Fuhrmann, “Morphological Studies of Spin-Coated Films of Poly(Styrene-Block-Methyl Methacrylate) Copolymers by Atomic Force Microscopy,” Colloid Polym.Sci. 272, 367–371 (1994).
O. M. Leung and M. C. Goh, “Orientational Ordering of Polymers by Atomic Force Microscop Tip-Surface Interactions,” Science 255, 64–66 (1992).
T. Schimmel, J. Köppers, and M. Lux-Steiner, “Lattice-resolution AFM on the layered dichalcogenide WSe2 in the sliding regime,” Thin Solid Films 264(2), 212–216 (1995).
G. Krausch, M. Hipp, M. Böltau, O. Marti, and J. Mlynek, “High resolution imaging of polymer surfaces with chemical sensitivity,” Macromolecules 28, 260263G (1995).
C. A. J. Putman, K. O. Van der Werf, B. G. Degrooth, N. F. Van Hu1st, and J. Greve, “Tapping Mode Atomic Force Microscopy in Liquid,” Appl. Phys. Lett. 64, 2454–2456 (1994).
P. K. Hansma, J. P. Cleveland, M. Radmacher, D. A. Walters, P. E. Hillner, M. Bezanilla, M. Fritz, D. Vie, H. G. Hansma, C. B. Prater, J. Massie, L. Fukunaga, J. Gurley, and V. Elings, “Tapping Mode Atomic Force Microscopy in Liquids,” Appl. Phys. Lett. 64, 1738–1740 (1994).
J. P. Spatz, S. Sheiko, M. Möller, R. G. Winkler, and O. Marti, “Forces affecting a substrate in tapping mode,” Nanotechnology 6, 40–44 (1995).
J. P. Spatz, S. Sheiko, M. Möller, R. G. Winkler, and O. Marti, “Forces affecting a substrate in tapping mode,” Nanotechnology 6, 40–44 (1995).
K. O. Van der Werf, C. A. J. Putman, B. G. Degrooth, and J. Greve, “Adhesion Force Imaging in Air and Liquid by Adhesion Mode Atomic Force Microscopy,” Appl. Phys. Lett. 65, 1195–1197 (1994).
J. W. S. Hearle, Polymers and Their Properties( John Wiley & Sons, New York, 1982 ).
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1997 Springer Science+Business Media Dordrecht
About this chapter
Cite this chapter
Marti, O., Hild, S., Staud, J., Rosa, A., Zink, B. (1997). Nanomechanical Interactions of Scanning Force Microscope Tips with Polymer Surfaces. In: Bhushan, B. (eds) Micro/Nanotribology and Its Applications. NATO ASI Series, vol 330. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-5646-2_36
Download citation
DOI: https://doi.org/10.1007/978-94-011-5646-2_36
Publisher Name: Springer, Dordrecht
Print ISBN: 978-94-010-6381-4
Online ISBN: 978-94-011-5646-2
eBook Packages: Springer Book Archive