Abstract
Scanning Force Microscopes and Friction Force Microscopes are built in wide variety of designs. They have become welcome additions to industrial laboratories due to their ruggedness and because their measurement principle is, in many respects, a refinement of well established apparatus such as profilometers and tribometers. This article discusses the building blocks of scanning force microscopes.
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© 1997 Springer Science+Business Media Dordrecht
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Marti, O. (1997). Instrumentation for Scanning Force Microscopy and Friction Force Microscopy. In: Bhushan, B. (eds) Micro/Nanotribology and Its Applications. NATO ASI Series, vol 330. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-5646-2_2
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DOI: https://doi.org/10.1007/978-94-011-5646-2_2
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