Abstract
In many solids, energetic heavy ions of typically several MeV/u produce long, narrow damage trails, commonly named latent tracks. These tracks represent objects of very limited size which are particularly suited for studies of material properties such as friction or elasticity on a nanometer scale. We present scanning force microscopy studies of latent tracks on the original surface of mica, i.e., without cleaving the sample prior to data acquisition. The microscope was operated in ultrahigh vacuum. The ion-impacted zones appear as small hillocks with an increased friction. By deconvoluting the simultaneously acquired topographic and so-called lateral-force images, it is possible to separate the purely frictional from the topographic contributions. In addition, wear processes were observed for higher loading forces of the sensor.
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References
Silk, E. C. H., Barnes, R. S. (1959) Examination of fission fragment tracks with an electron microscope, Phil. Mag. 4, 970–972
Dartyge, E., Lambert, M., (1974) Formation de defauts dans les echantillons de mica muscovite irradies par des ions de grand energie, Radial. Eff. 21, 71–79
Dartyge, E., Duraud, J. P., Langevin, Y., Maurette, M. (1981) New model of nuclear particle tracks in dielectric minerals, Phys. Rev. B 23, 5213–5229
Albrecht, D., Armbruster, P., Spohr, R., Roth, M., Schaupert, K., Stuhrmann, H. (1985) Investigation of heavy ion produced defect structures in insulators by small angle scattering, Appl. Phys. A 37, 37–46
Albrecht, D., Balanzat, E., Schaupert, K. (1986) X-ray small angle scattering investigation of high energy Ar-tracks in mica, Nucl. Tracks Radial. Meas. 11, 93–94
Chailley, V., Dooryhée, E., Bouffard, S., Balanzat, E., Levalois, M. (1994) Observations by X-ray diffraction of structural changes in mica irradiated by swift heavy ions, Nucl. Instrum. and Meth. B 91, 162–167
Thibaudau, F., Cousty, J., Balanzat, E., Bouffard, S. (1991) Atomic-force-microscopy observations of tracks induced by swift Kr-ions in mica, Phys. Rev. Lett. 67, 1582–1585
Bouffard, S., Cousty, J., Pennec, Y., Thibaudau, F. (1993) STM and AFM observations of latent tracks, Radial. Eff. Def. Sol. 126, 225–228
Schneider, D., Briere, M. A., Clark, M. W., McDonald, J., Biersack, J., Sieghaus, W. (1993) Surf. Sci. 294, 403–408
Schneider, D., Briere, M. A., McDonald, J., Biersack, J. (1993) Ion/surface interaction studies with 13 keV/amu ions up to Th80+, Rad. Eff. Def Sol. 127, 113–136
Schneider, D., Briere, M. A., McDonald, J., Biersack, J. Observation of defects on insulator surfaces following bombardment with slow Kr35+ Xe44+ Th74+, and U70+ ions, Nucl. Instrum. and Meth. B 87, 156–161 (1994)
Hagen, T., Grafström, S., Ackermann, J., Neumann, R., Trautmann, C., Vetter, J., Angert, N. (1994) Friction force microscopy of heavy-ion irradiated mica, J. Vac. Sci. Technol. B 12, 1555–1558.
Daya, D. D. N. B., Hallén, A., Häkansson, P., Sundqvist, B. U. R., Reimann, C. T. (1995) Swift-heavyatomic-ion-induced surface tracks on mica probed by scanning force microscopy, Nucl. Instrum. and Meth. B 103, 454–465
Ackermann, J., Angert, N., Neumann, R., Trautmann, C., Dischner, M., Hagen, T., Sedlacek, M. (1996) Ion track diameters in mica studied with scanning force microscopy, Nucl. Instrum. and Meth. B 107, 181–184
Ackermann, J., Angert, N., Grafström, S., Hagen, T., Neitzert, M., Neumann, R., Trautmann, C. (1995) Force microscopy of heavy-ion irradiated materials, in Güntherodt, H.-J., Anselmetti, D., and Meyer, E. (eds.), Forces in Scanning Probe Methods, Kluwer Academic Publishers, Dordrecht, Boston, London, pp. 489–494.
Neumann, R., Ackermann, J., Angert, N., Trautmann, C, Dischner, M., Hagen, T., Sedlacek, M. (1995) Ion tracks in mica studied with scanning force microscopy using Force modulation, submitted to Nucl. Instr. and Meth. B
Mate, C. M., McClelland, G. M., Erlandsson, R., Chiang, S. (1987) Atomic-scale friction of a tungsten tip on a graphite surface, Phys. Rev. Lett. 59 (17), 1942–1945
Erlandsson, R., Hadziioannou, G., Mate, C. M., McClelland, G. M., Chiang, S. (1988) Atomic scale friction between the muscovite mica cleavage plane and a tungsten tip, J. Chem. Phys. 89 (8), 5190–5193
Meyer, E., Ovemey, R., Brodbeck, D., Howaldt, L., Lüthi, R., Frommer. J., Güntherodt, H.-J. (1992) Friction and wear of Langmuir-Blodgett films observed by friction force microscopy, Phys. Rev. Lett. 69 (12), 1777–1780
Ovemey, R. M., Bonner, T., Meyer, E., Rüetschi, M., Lüthi, R., Howald, L., Frommer, J., Güntherodt, H.-J., Fujihira, M., Takano, H. (1993) Elasticity, wear, and friction properties of thin organic films observed with atomic force microscopy, J. Vac. Sci. Technol. B 12 (3), 1973–1976
Hu, J., Xiao, X.-d., Ogletree, D. F., Salmeron, M. (1994) Atomic scale friction and wear of mica, Surf Sci. 327, 358–370
Kageshima, M., Yamada, H., Morita, Y., Tokumoto, H., Nakayama, K., Kawazu, A. (1994) Tip-induced surface disorder of hydrogen-terminated silicon (111) surface observed by ultrahigh-vacuum atomic force microscopy, Jpn. J. Appl. Phys. 33, 3735–3738
Lüthi, R., Meyer, E., Haefke, H., Howaldt, L., Güntherodt, H.-J. (1995) Nanotribology: an UHV-SFM study on thin films of AgBr(001), Tribol. Lett. 1, 23–33
Howald, L., Meyer, E., Lüthi, R., Haefke, H., Ovemey, R., Rudin, H., Güntherodt, H.-J. (1993) Multifunctional probe microscope for facile operation in ultrahigh vacuum, Appl. Phys. Lett. 63, 117–119
Ackermann, J. (1994) Rasterkraftmikroskopie an Schwerionen-bestrahlten Materialien: Spuruntersuchungen and Entwicklung eines UHV-Kraftmikroskops, Doctoral thesis, Universität Heidelberg
Sedlacek, M. (1995) Rasterkraftmikroskopie an Schwerionenspuren unter Umgebungs-and Ultrahochvakuum-Bedingungen, Diploma thesis, Universität Heidelberg
Wörtge, M., Dey, S., Grafström, S., Hagen, T., Kowalski, J., Neumann, R., Probst, 0. (1994) An ultrahigh-vacuum system for STM studies, Rev. Sci. Instr. 65, 2523–2526
Grafström, S., Neitzert, M., Hagen, T., Ackermann, J., Neumann, R., Probst, 0., Wörtge, M. (1993) The role of topography and friction for the image contrast in lateral force microscopy, Nanotechnology 4, 143–151
Grafström, S., Ackermann, J., Hagen, T., Neumann, R., Probst, 0. (1994) Analysis of lateral force effects on the topography in scanning force microscopy, J. Vac. Sci. Technol. B 12 (3), 1559–1564
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Ackermann, J., Grafström, S., Hagen, T., Kowalski, J., Neumann, R., Sedlacek, M. (1997). Scanning Force Microscopy of Latent Heavy-Ion Tracks in Ultrahigh Vacuum. In: Bhushan, B. (eds) Micro/Nanotribology and Its Applications. NATO ASI Series, vol 330. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-5646-2_17
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DOI: https://doi.org/10.1007/978-94-011-5646-2_17
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